Scanning Electron Microscopes

The scanning electron microscope is used to analyze the surface of specimens over a wide range of magnifications. ...more

FabFloor is a new concept for equipment pedestals and semiconductor machinery tool stands. Highly rigid honeycomb panels are used to support precision equipment such as lithography steppers, scanning electron microscopes and profilometry inspection machines. ...more

Chemical analysis is to determine the amounts of each element in the substance by instruments or sensors. Methods are classified into two major groups, Classical (chemical or wet), which are based on chemical rxns, for example gravimetric (isolate and weight), and Instrumental (complex equipment including sensors). Instrumental Equipment inclu ...more

Physical Testing is to determine physical properties of materials. Such properties include density (weight per unit volume of material), specific gravity (ratio of weight of a given volume of a certain material to that of the same volume of water at stated temperature), water absorption (moisture content may result in changes in dimensions or ...more

Spellman's EBM High Voltage Triode Module designed for driving E-Beam Columns in Scanning Electron Microscopes, provides the required acceleration, ...more

This versatile microscope with a thermal FE source has been designed for applications in the semiconductor industry, materials and biological sciences where excellent beam stability, and high resolution are essential. ...more

In spite of semi-in-lens SEM, in-lens SEM equivalent specification has been realized. Observation for standard 6inch or maximum 8inch (Option) wafer. Wider non-destructive observation. Image observation for various purposes is performed by the super ExB that is selectable information switch for signals from one detector. Ultra low acceleration volt ...more

Like no other SEM in the world... The world's highest resolution 0.4nm at 30kV. Hitachi's unique variable super ExB signal mode allows operator to optimize secondary and backscatter signal content of the image. New BF/DF Duo-STEM detector allows simultaneous display of BF and DF images. Variable detection angle in DF STEM mode(option). ...more

Compact & High-performance 20 % Reduction in Footprint Compared to the Current Model. VP Mode Standard. SE 3.0 nm Resolution at 30 kV, BSE 4.0 nm (6 Pa) Guaranteed. Accommodates Samples up to 152 mm (diameter) and 60 mm (height). Provides for Two EDX Symmetrical Ports. ...more

The Analytical SEM for Studying Large, Heavy & Tall Samples. Large sample up to 300mm in diameter. Observable area up to 203mm in diameter. Observation and EDS analysis on a sample up to 110mm tall. Versatile port layout for various analytical applications. ...more

Response Dynamics provides a broad range of vibration and acoustical engineering consulting services to the semiconductor industry, the biotech industry and other high tech industries worldwide since 1984. We solve problems ranging from the nanometer level vibration issues on scanning electron microscopes, interferometers, and atomic force microsc ...more

The S-4300SE/N brings the resolution capabilities of the high brightness field-emission electron gun to variable pressure scanning electron microscopy. The wide operating pressure range of 10 - 1000 Pa allows examination of an even wider range of wet, oily or nonconductive samples. ...more

The S-4300 offers excellent resolution capabilities of 1.5nm at 15kV and an impressive 5.0nm at just 1 kV. The S-4300 also features an integral image management processing & archiving system, which allows up to 40 thumbnail images to be displayed simultaneously. ...more

Model SU-70 is a new concept SEM incorporating field proven Hitachi’s semi-in-lens technology for ultra high resolution, and Schottky electron gun. It features not only ultra high resolution (1.0 nm/15kV, 1.6nm*/1 kV), but also observation of charge-up reduced image, compositional contrast image, ultra-low accelerating voltage image*, benefiting fr ...more

A yet more user-friendly SEM through newly developed electron optics and Automatic functions. Revolutionary automatic axis-alignment functions. (Auto Beam Setting, Auto Axial Alignment, etc.). Even better resolution of 10nm at 3kV. ...more