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Product
Combined Environmental Reliability Test System
VTC SERIES
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HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.
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Product
Laser Diode Burn-in Reliability Test System
58604
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The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
RELIABILITY BOARD (Reliability Test Board)
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The reliability test board is used for testing of HAST, THB, HTOL, BURN-IN, etc. It is a product that evaluates the environmental test and durability when applied to actual products such as lifetime test, high temperature, low temperature, high humidity and thermal shock
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Product
Reliability Testing Services
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Innovative Circuits Engineering, inc
Our Reliability Testing Services make it possible for us to work with many different customers who manufacture devices that need tests such as pressure pot, temp cycle and more.The focus of our reliability testing lab is to provide our customers with an array of services and tests that fulfill all of their reliability testing needs. Whether you need preconditioning, thermal shock, pressure pot, or many other reliability testing needs, we are happy to be of service.
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Product
Vibration Test Systems
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HIACC Engineering & Services Pvt. Ltd.
Designed to simulate real-world vibration, shock, and environmental stresses for product reliability testing.
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Product
UV Measurement
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The UV measuring system with the tesa UV Strip and the UV Scan from Hönle is suitable for the reliable testing of the UV dose on the object.
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Product
6TL19 Off-Line Base Test Platform
H71001900
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The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
PXI 10A Fault Insertion Switch 10-Chan 2-Bus
40-199-002
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The 40-199 is a 10 Channel Fault Insertion switch designed for the simulation of fault conditions in automotive/avionics applications, involving the reliability testing of safety critical controllers.
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Product
Benchtop Vibration Table
TCB-1.3
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The TCB-1.3 benchtop vibration chamber is ideal for reliability testing of compact products and electronics. It may be used as a stand-alone vibration table for vibration testing or placed inside an environmental chamber for combined random vibration & temperature testing offering flexibility and greater return on investment.
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Product
Video Signal Distributor
MSHD-10N
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MSHD-10N distribute received one(1) D-TV(Y,Pb, Pr) and audio(R,L) signal to the ten(10) channels. It is recommended reliable test room and show room.
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Product
PXI 10A Fault Insertion Switch 10-Chan 1-Bus
40-199-001
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The 40-199 is a 10 Channel Fault Insertion switch designed for the simulation of fault conditions in automotive/avionics applications, involving the reliability testing of safety critical controllers.
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Product
Single Bus 36-Channel 2A PCI Fault Insertion Switch
50-190-201
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This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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Product
Secondary Injection Relay Test Set
TD 1000 PLUS
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TD1000+ is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment. In comparison with T 1000 PLUS model, TD 1000 PLUS has two current outputs to test the differential relay characteristic curve, besides the pick-up current.
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Product
Servo Vertical Shock Tester
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HIACC Engineering & Services Pvt. Ltd.
The shock tester is commonly used for the reliability damage test of the electrical & electronic components by simulating an impact environment.
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Product
Envinronmental Chambers
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MRC environmental test chambers with temperature and humidity control. Chamber Test Humidity and Temperature Programmable humidity and temperature of range full a simulates freezing, climatic, durability, reliability test to conditions .etc endurance thermal, assurance quality.
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Product
Burn-in Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's High Temperature Aging Chamber is widely applied for automotive parts ,electronic and electric products ,components and materials by constant high temperature reliability test.
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Product
Single Bus 64-Channel 2A PCI Fault Insertion Switch
50-190-101
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This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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Product
IC Product Testing & Analysis Services
Integrated Service Technology
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Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
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Product
Test Fixtures
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At A.T.E Solutions we have a dealt with a wide range of test subjects in the past 30 years and have extensive experience in providing reliable test fixture solutions.
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Product
Bare Board Tester
1232
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High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices. The 1232 is a bare board tester that utilizes the full range of Hioki’s in-circuit testing technologies to deliver LSI reliability testing, complex component separation testing, high continuity and insulation testing, and more. (Double-sided alignment) Testable board dimensions: 50 × 50 to 330 × 330 mm (including clamp area) • Support for build-up boards that require resistance guarantees.
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Product
PXI 34-Channel 4-Bus 2A Fault Insertion Switch
40-197A-001
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This 34-channel fault insertion switch is primarily intended for routing simulated fault conditions in automotive and aerospace applications involving the reliability testing of safety critical controllers. A low cost 16-channel option is also available.
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Product
Compact Functional Test System
E2230C / TS-5040
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The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Product
Automated Multi-Functional Tester
QTouch 1408 C
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Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Product
AC High Voltage Breakdown Tester
CIE / 5050A
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Cambridge Instruments & Engineering Co.
'CIE' A.C. High Voltage Breakdown Test Set is ideal for fast accurate & reliable testing of withstand/Breakdown test of electrical & electronic materials, components, equipments, panel boards, etc.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
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The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
