Probers

Application of new and innovative design features to increase test speed, board access, reliability, and repeat-ability, have opened up new possibilities for deployment of Acculogic’s FLS900 series testers. As the first patented flying prober with double sided testing and 24 interchangeable probe modules, the FLS900 is leading the way in defining n ...more

The Sprint 4510 Flying Prober's superior design and engineering and high MTBF make it your best test investment. Flying Probe testers do not require fixtures and can make precise contact with assemblies under test, thereby abating problems associated with board access. Test programs can be prepared quickly and set-up times are almost eliminate ...more

DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. ...more

Developed to meet the critical needs of 90 nm or smaller process technologies used by semiconductor manufacturers, the SUSS PM8WLR probe system provides long-term process reliability measurements at temperatures up to 300°C. The prober itself is built using SUSS renowned stability, and provides the ideal platform for long-term measurements at ...more

The Huntron Access Prober is designed to accurately access test points on printed circuit assemblies (PCAs). It's 20 micron accuracy achieved by micro-stepping and linear encoding ensures reliable probing of the smallest surface mounted components. By using either the standard built-in test probe or a custom test probe, the Huntron Access Pro ...more

Chroma 58153 LED Wafer/Chip Prober System is a precision machine specifically designed for probing applications involving LED or Laser Diode wafers/chips from 2" to 8". A state of the art vision system with industrial camera, video capture board, and image processing software is incorporated in the 58153 prober system to support high ...more

This is a double side wafer prober, developed to be a low-cost manual version of the WS50. All checks, from mounting the wafer to driving the stages, including checks for the positioning of pins, the pressure of pins on the chip, and scrub mark, can be performed manually.  ...more

SUSS MicroTec has made the fastest wafer-level solution for testing discrete devices even better. The BlueRay probe system is now the only probe system in the world that can be upgraded from a semiautomatic to a fully-automated wafer prober in the field and in only a couple of hours.  ...more

inTEST direct-dock wafer probing interfaces give you the best of both worlds, combining the highest performance electrical interconnect components with the most dependable mechanical assemblies. We work closely with the major test and wafer prober manufacturers to design our products into their probing platforms, ensuring compatible form, fit, ...more

DB Design Group offers the Vac-Lock Docking System for test floor equipment docking. Hard docking is often required between the test head and device handler or wafer prober. ...more

Flying Scorpion is a new generation flying prober to test complex boards in prototype and small to medium batches. It was designed especially to cater for manufacturing assembly problems presented by mixed technology surface mount designs and high pin count, prototypes, samples, low volume boards, faulty boards. ...more

Flying Prober. maximum testfield: 24"x24"probeheads: 4 or 8 (2/4 on top, 2/4 on bottom)test voltage: 25 - 250VDCaccurcy: ±10 micron / 0.4miltest speed: up to 2400 tests per minute ...more

Since the WS50 provides ideal test methods for testing high-voltage devices, it is capable of high-accuracy testing and high reliability using a newly-developed contact method for both sides probing wafers.  ...more

The SUSS PM8 Analytical Prober is the benchmark in manual failure analysis and in-process testing. This modular system meets customers' needs for precision, reliability and cost of ownership. Flexibility in optics and microscope travel options encourage configuration of the system according to actual needs and budget constraints. ...more

The Docking Gusset Assembly (DGA) is the piece that mounts to your handler or prober. It normally consists of a plate to which the docking gusset bars and coarse alignment pins are attached. ...more

Backside Emission Probe Systems from SUSS are designed for probing different substrates by contacting the device under test (DUT) with needles from the contact side (top side) and inspect or stimulate the backside (bottom side) with an emission detection unit. The probers are compatible with all bottom-up observation systems from all major ven ...more

Today´s highly integrated devices often require analytical analysis while in a fully functional state ("At Speed Testing"). Using a cabled Interface between a manual prober and the Tester reduces the possible clock rate and makes At Speed Testing impossible. ...more

This PRA is for an EG Prober with an RC14 ring carrier. It is designed with a 4 inch x 8 inch probe card with a 320 signal SPRI. This product can be custom designed to fit your pin count and probe card size or shape requirements. ...more

The PCSR (Probe Card Support Ring) is designed for an EG prober with an RC2 ring carrier. It is engineered to allow for different probing depths thus allowing for adjustment in the field. ...more

This software tool brings wafer level calibration to a new level. Designed to facilitate, simplify and automate the complicated task of the HF measurement system calibration, it can be used in conjunction with all types of probe systems. 50x faster than manual calibration, SussCal controls the prober for positioning the calibration substrate(s ...more

The SUSS EP4 has been especially designed for academic use, in order to familiarize students with probing. For this reason, the prober has been reduced to its simplest form, to allow a very quick and easy utilization. ...more

Pneumatic Inking System -Remote Valve -Designed specifically for the TEL P8 prober ...more

The APS 80 DSP, automatic double-sided prober for 2-inch to 6-inch wafers, is ideal for high volume, double-sided wafer applications such as power device production. User-friendly LabMaster-derived system software delivers push button simplicity with a full complement of control parameters, including real-time yield analysis of both the wafer ...more

Selection of Handler Interface includes HB-100 providing relay closures or logic level (positive logic) with software programmable End Of Test (EOT) and PI-200 providing positive or negative logic with hardware adjustable End Of Test (EOT) and bin pulse widths. ...more

The AWP 2803 DSP, semi-automatic prober, is ideal for the simultaneous, dual-side probing of devices such as high-power MOSFETs. Based on Wentworths highly versatile AWP probe station platform, the AWP 2803 DSP delivers optimum probing performance for 3-inch to 6-inch wafers. ...more