Probe Stations

MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or ...more

Toolkit seamlessly incorporates National Instruments LabVIEW into SUSS MicroTec probe stations to customize and automate wafer-level test applications ...more

The SUSS AP200 combines the versatility of an analytical probe station with the throughput of a loader module. Specially designed to carefully handle the most sensitive of substrates, the AP200 is ideally suited for probing MEMS, SAW filters and other devices that need a high level of customization. ...more

Best probe station for testing up to 300 mm. Ideal for failure analysis and device characterization and modeling (DC to 325 GHz). ...more

The DuoCHUCK Integrated Hot Chuck System: Designed for high throughput CVBT mobile ion tests. Contains two hot chucks and all associated control, multiplexing, and stress bias circuitry to make measurements on one to five C-V dots on each chuck. The DuoCHUCK has 10 times the capacity of a conventional single dot probe station. ...more

Complete 150 mm RF wafer-probing package: probe station, microscope, ProbeHeads™, wafer probes and cables and SussCal® Professional. ...more

Complete 150 mm DC wafer-probing package: probe station, microscope, ProbeHeads™, probes and cables. ...more

Setting a new standard for high-speed accuracy, the BlueRay™ probe station is precisely the solution you need for wafer-level functional test of discrete devices. ...more

The QDI 302 Microscope Spectrophotometer is designed to add spectroscopy and imaging to your optical microscope.  It can also be used to upgrade a legacy microspectrometer or to add spectroscopic and film thickness capabilities to a probe station. The QDI 302 attaches to the microscope, microspectrometer or probe station and enables you to coll ...more

The MDC Model 441 Cryogenic Probe Station is a cost effective alternative to high-priced vacuum based cryogenic probe stations. With up to five probes available and sample diameters up to six inches, the MDC Cryogenic Probe Station allows for electrical measurements at temperatures near liquid nitrogen levels (77K) ...more

Various field probes available according to requirements. Several 2600 area monitors connected to the base station through the GSM network can be used to build reliable monitoring systems to cover large geographical areas, including nation-wide coverage. Automatic & manual data download to PC base station by internal GSM modem; dedicated a ...more

REL-4800 Manual Probe Station, 8 in. ...more

Probe holder, For package and interconnect, MSI integrated circuit, microwave semiconductor, hybrid, and electro-optic device probing applications. W= Base X= Arm Length & Wafer diameter, Y= Position, Z= Position w/ respect to operator facing station. ...more

REL-4821 8 in. Manual Probe Station, thermal, nickel-plated chuck ...more

REL-4822 8 in. Manual Probe Station, thermal, gold-plated chuck ...more

REL-4821 8 in. Manual Probe Station, thermal, nickel-plated, high temperature chuck ...more

REL-4822 8 in. Manual Probe Station, thermal, gold-plated, high temperature chuck ...more

REL-4831 8 in. Manual Probe Station, guarded thermal, nickel-plated chuck ...more

REL-4832 8 in. Manual Probe Station, guarded thermal, gold-plated chuck ...more

REL-4831 8 in. Manual Probe Station, guarded thermal, nickel-plated high temperature chuck ...more

REL-4832 8 in. Manual Probe Station, guarded thermal, gold-plated high temperature chuck ...more

REL-4841 8 in. Manual Probe Station, guarded nickel-plated chuck ...more

REL-4842 8 in. Manual Probe Station, guarded gold-plated chuck ...more

REL-6100 Semiautomatic Probe Station (8 in.) ...more

REL-6121 8 in. Semiautomatic Probe Station, thermal, nickel-plated chuck ...more