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Product
Low-Noise Parametric Amplifiers
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Insight Product Company offers Low-Noise Parametric Amplfiers based on Monolithic Integrated Circuits (MIC) in the frequency range of 30 to 100 GHz.
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Product
Parametric Analyzer
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FA Instruments Parametric Analyzer offers all the functions of a 'big box' circuit testing solution, without the 'big box' footprint!The Parametric Analyzer is an advanced software module that can performs within the Crystalvision suite. The module provides all the functionality and testing schemes you would expect from a high-end solution, with all functionality being geared towards providing the maximum information to the FA engineer.
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Product
Programmable Parametric Tester For Discrete Semiconductors
IST-8800
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IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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Product
Production Parametric Probe Card
VC20TM Fab
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*Maximum channel count: 48*Tester platforms: Keysight 4062, 4072, 4080, Keithley S600, S530, Rack and Stack configurations.*Minimum Pad Size: 30ux30u (tunable scrub)*Contact Resistance: less than 1 ohm*Temperature range: -65C to 200C*Leakage: Less than 5 femto Amps per volt. If you require faster settling time*Repairable*Lifetime Performance: Production customers are experiencing 10M+ million touchdowns on Aluminum and Copper pads. Few to no rebuilds due to pobe wear
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Product
Automated DC Parametric Curve Tracer
MultiTrace
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MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Product
Optical Parametric Amplifier
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AVUS is an Optical Parametric Amplifier (OPA) that provides widely tunable high energy pulses and high repetition rates (up to 1 MHz). AVUS offers highest average output power on the market and is designed for 1 µm fs pump lasers.
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Product
Automated DC Parametric Curve Tracer
MegaTrace
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MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.
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Product
Parametric Test Solutions
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Reduce your cost-of-test up to 20% with our ultra-fast CPU Overcome your process test challenges Boost measurement throughput and lower costs with our synchronous/asynchronous parallel test capability Better low-level measurement performance Create customized waveforms Reduce transition costs
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Product
Parametric Test Fixture
U2941A
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The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Femtosecond Optical Parametric Amplifier
CDP 2017
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*> 30% conversion efficiency from pump pulse to parametric radiation*Wavelength conversion for ExciPro, TAPPIR, FOG 100-DA*Wavelength conversion options for wavelength tuning from 240 nm to 16 mm
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Product
Advanced ARINC-429 Testing Ethernet Appliance - Parametrics TX Variable Voltage, Digital Signal Generator and RX Signal Capture
ENET-A429P
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eNet-A429P™ is an innovative product that provides “remoting” of ARINC operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). eNet-A429P is a small, low-power, device ideal for details ARINC signal testing with variable voltaqe control of the first 3 TX channels. Alta has combined the industry’s most advanced 32-bit ARINC FPGA protocol engine, AltaCore™, with a real-time IP/UDP thin server. The customer can implement their application with the same feature-rich application programming interface, AltaAPI™, as used with standard cards – often without even recompiling – the utlimate in code portability.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Optical Parametric Oscillators
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Our optical parametric oscillators are the most advanced in the industry, with leading technology plus a range of options to suit every system and customer need.
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Product
DDR4 Parametric Test Reference Solution
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Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
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Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
