Microscopy

The S-4300SE/N brings the resolution capabilities of the high brightness field-emission electron gun to variable pressure scanning electron microscopy. The wide operating pressure range of 10 - 1000 Pa allows examination of an even wider range of wet, oily or nonconductive samples. ...more

The ABL3600 dual-axis, large aperture, open-frame, airbearing stage addresses the unique needs of scanning microscopy and mask and wafer inspection. ...more

The PML 8000, analytical prober, delivers an economical 8-inch probing platform for failure analysis, device characterization and inline process verification. Its compact base design and extensive feature set are ideally suited for diverse applications, including small geometry probing, applications using high power optics, design debug, wafer ...more

The demand for a high accuracy, robust, open-frame stage is met with the ATS3600. This dual-axis, large aperture, open-frame stage addresses the unique needs of scanning microscopy, wafer and printed circuit board inspection, and automated assembly. ...more

C-Mode scanning 10-100MHz, non-destructive ultrasonic examination of materials and electronic components Evaluation and characterization Capacitors, semiconductors, integrated circuits Hybrid circuits (lidded & unlidded) Printed wiring boards (PWB) including multi-layer core boards ...more

The NEW BioScope SZ Atomic Force Microscope offers full atomic force microscopy on a high-power inverted optical microscope. ...more

The Model 370 Scanning Electrochemical Workstation is a new concept in Scanning Probe Electrochemistry, designed for ultra-high resolution, spatially resolved electrochemical measurements. The Model 370 is a configurable system which will perform all the key Scanning Probe Electrochemical Techniques. Scanning Electrochemical Microscopy (SECM). Sca ...more

It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. ...more

Automotive Testing is meant to analyze the expected or actual reliability of automotive parts. Failure analysis and contamination analysis can also be provided. Automotive Testing includes bell housing testing by centrifugal exploding flywheels at ~12,000 RPM inside of the bell housings, testing blower restraints, driver restraints, window net ...more

The di MultiMode V represents the next generation of the world's best-selling, most field-proven SPM. It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. A short mechanical pa ...more

The di Dimension V scanning probe microscope utilizes atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter. Its laser spot alignment system and the abil ...more

JMAR's  products add the capability of atomic force microscopy (AFM) to our inspection metrology platforms. JMAR's  resolves, literally, sub-nanometer details.  ...more

The Dimension Vx200/300 Atomic Force Profiler (AFP) combines the resolution of an atomic force microscope (AFM) with the long scan capability of a profiler to offer the highest performance profiling and atomic force microscopy available. It offers non-destructive profiling for CMP control and characterization and high aspect ratio depth measur ...more

BioScope Atomic Force Microscope offers full atomic force microscopy on a high-power inverted optical microscope, thereby combining nondestructive scanning with familiar sample preparation, mounting, and optical capabilities. ...more

The Dimension 5000 Scanning Probe Microscope (SPM) provides the ultimate in automated large-sample capability for semiconductor and data storage device manufacturers, measuring up to one hundred areas on samples up to 350 mm in diameter. With the entire range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques a ...more

The Dimension 3100 Scanning Probe Microscope (SPM) utilizes automated atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200 mm in diameter. Its laser spot alignme ...more

High magnification to 100,000X High resolution imaging with Energy Dispersive X-Ray (EDX) to identify and quantify elements down to Atomic Number 5 (Boron) ...more

Uses Scanning Near-Field Optical Microscopy (SNOM) to investigate optical properties beyond the conventional limits imposed by diffraction. NTEGRA Solaris combines three different microscopy techniques: light, scanning nearfield optical microscopy (SNOM), and atomic force microscopy (AFM). Integration at this advanced level creates enormous design ...more

The SkyScan 1172 Desktop X-ray Microtomograph (Micro-CT) employs new ADAPTIVE GEOMETRY to provide non-destructive 3D microscopy of the internal structures of small objects with high spatial resolution and unprecedented speed. The 1172 moves the source and camera closer together, according to the field of view, to increase the intensity of X-ra ...more

The Candela 5100 system combines five independent detection methods: scatterometry, reflectometry, ellipsometry, optical profilometry, and Kerr effect microscopy in a compact, cost-effective system. Its measurements are well-suited for a variety of production monitoring, process development, and surface analysis applications. The OSA system sc ...more

The New SkyScan-1174 is a compact, low-cost, portable X-Ray scanner for nondestructive three-dimensional microscopy. It can be connected to any Pentium-based PC or laptop by serial port or USB & FireWire. The 1174 is supplied with software for system control, X-ray radiography and 3D-reconstruction. The main areas of application are metal ...more

The unique design of the DS45-40 makes it a tool of choice for OEM application such as in nano-indentation, optical and electron microscopy. It can also be used as a stand-alone tool for surface charaterization of virtually any type of materials. ...more

Applications in the field of microscopy often require a positioning element with a free central hole. The model PXY 400 combines its compact size with a large motion of 400 x 400 µm.400 µm. A new design of the actuator produces a high resonant frequency and an improved dynamic behavior. Its free central space of 22 x 22 mm makes this element i ...more

Failure Analysis service - Electrical testing, curve tracing, micro-section analysis, microscopic inspection, structural integrity testing, field emission scanning electron microscopy (FE-SEM), Fourier Transform Infrared (FTIR) analysis and component package decapsulation. ...more

Delivers the complete solution for observation of magnetization reversal processes and other phenomena that depend on magnetic field in the range up to 2 kGauss (0,2 Tesla). Measuring modes: SPM techniques: In air: Atomic Force Microscopy (AFM) (contact + semicontact + non-contact)/ Lateral Force Microscopy (LFM)/ Phase Imaging mode/ Force Modu ...more