Microscopes

Handheld fiber microscope enables end-face inspection on patch cords. Easy, manual focus of precision optics. Available in 200x or 400x magnification. Use FiberViewer microscopes to ensure fiber terminations are smooth and clean. Avoid the #1cause of cause of fiber link failure: dirty end-faces. ...more

Handheld microscopes for fiber optic connector end-face inspection. FT600 FiberInspector easily inspects installed fiber connectors on patch panels and hardware devices.  ...more

This versatile microscope with a thermal FE source has been designed for applications in the semiconductor industry, materials and biological sciences where excellent beam stability, and high resolution are essential. ...more

In spite of semi-in-lens SEM, in-lens SEM equivalent specification has been realized. Observation for standard 6inch or maximum 8inch (Option) wafer. Wider non-destructive observation. Image observation for various purposes is performed by the super ExB that is selectable information switch for signals from one detector. Ultra low acceleration volt ...more

Combination of high reputation Hitachi cold field emission electron source and 300 kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Double bi-prism holography, spatially resolved EELS and high precision parallel nanobeam electron beam diffraction open a new avenue for efficient and high precision mat ...more

The luminous flux photometric system comprises of a L203 or L300 series photometer with an integrating and photopic detector. Applications for luminous flux measurements include automotive and miniature lamps, LEDs and light guided sources such as microscope and endoscope illuminators. ...more

The ATS100 linear stage provides the high resolution and repeatability required for semiconductor wafer testing and fabrication, automated microscope inspection systems, and precision micromachining applications. ...more

Response Dynamics provides a broad range of vibration and acoustical engineering consulting services to the semiconductor industry, the biotech industry and other high tech industries worldwide since 1984. We solve problems ranging from the nanometer level vibration issues on scanning electron microscopes, interferometers, and atomic force microsc ...more

We are well equipped to relap and repair worn tape heads. Heads sent in for repair are put through a series of inspections to determine their condition and expected head life. Inspection procedures include evaluation under microscope and inductance measurement.  ...more

A compact tabletop microscope invites you to the stereoscopic micron world. Energy-saving design and compact size. No metal coating required to observe non-conductive samples. Easy to use. Quick change through desired magnifications. Stereoscopic observation with greater depth of focus. ...more

The S-4300 offers excellent resolution capabilities of 1.5nm at 15kV and an impressive 5.0nm at just 1 kV. The S-4300 also features an integral image management processing & archiving system, which allows up to 40 thumbnail images to be displayed simultaneously. ...more

Like no other SEM in the world... The world's highest resolution 0.4nm at 30kV. Hitachi's unique variable super ExB signal mode allows operator to optimize secondary and backscatter signal content of the image. New BF/DF Duo-STEM detector allows simultaneous display of BF and DF images. Variable detection angle in DF STEM mode(option). ...more

A yet more user-friendly SEM through newly developed electron optics and Automatic functions. Revolutionary automatic axis-alignment functions. (Auto Beam Setting, Auto Axial Alignment, etc.). Even better resolution of 10nm at 3kV. ...more

Compact & High-performance 20 % Reduction in Footprint Compared to the Current Model. VP Mode Standard. SE 3.0 nm Resolution at 30 kV, BSE 4.0 nm (6 Pa) Guaranteed. Accommodates Samples up to 152 mm (diameter) and 60 mm (height). Provides for Two EDX Symmetrical Ports. ...more

Compact microscope for sub-nanometric measurement. Powerful analysis software. Applications: R&D labs for Step height, bump size, Roughness, surface topography ...more

This kit contains a portable, handheld microscope and the appropriate … ...more

Inspect fiber optic cable quickly and safely! ...more

The ATS150 linear stage provides the high resolution and repeatability required for semiconductor wafer testing and fabrication, automated microscope inspection systems, and precision micromachining applications. ...more

The S-4300SE/N brings the resolution capabilities of the high brightness field-emission electron gun to variable pressure scanning electron microscopy. The wide operating pressure range of 10 - 1000 Pa allows examination of an even wider range of wet, oily or nonconductive samples. ...more

Model SU-70 is a new concept SEM incorporating field proven Hitachi’s semi-in-lens technology for ultra high resolution, and Schottky electron gun. It features not only ultra high resolution (1.0 nm/15kV, 1.6nm*/1 kV), but also observation of charge-up reduced image, compositional contrast image, ultra-low accelerating voltage image*, benefiting fr ...more

The KH-1300 digital microscope is revolutionary in that it achieves both the highest transfer speeds in its class and high-quality images at the same time. An original CCD camera was developed exclusively to create the highest quality images. As a result, high-resolution images can be transferred quickly allowing video to be observed on PC screens. ...more

The Analytical SEM for Studying Large, Heavy & Tall Samples. Large sample up to 300mm in diameter. Observable area up to 203mm in diameter. Observation and EDS analysis on a sample up to 110mm tall. Versatile port layout for various analytical applications. ...more

KH-7700 Digital Microscope System is HIROX's newest most advanced development. The digital camera, light source, LCD monitor, computer and software are all integrated into this one unit. The KH-7700 provides the user with the ultimate in high performance observation, measurement, analysis, recording, management, and output. ...more

The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research. ...more

The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering ...more