Memory Test System

The Tanisys Model 500 is the leading platform for flash card test today. Whether you have the need to test CompactFlash,MMC, SD, Memory Stick, USB cards, or even a proprietary card format, the Model 500 will fit your requirements.  ...more

For burning-in and testing state-of-the-art memory devices including Flash, SDR, DDR, RDRAM, Static, Applications Specifi c and Embedded memories. Burns-in and tests today?s and tomorrow?s memories ...more

Temperature control included with HPB-2, HPB-4, HPB-5, HPB-5A, HPB-5B. Screens burn-in boards prior to extended environmental burn-in. For use with any Micro Control Company memory or logic burn-in system. Single-board testing& ...more

Expanded frequency range of the new Model SA-6000EX is 25-6000 MHz. (The SA-2500EX is still available for applications only requiring the limited frequency range of 780-2500 MHz. Expanded memory now allows saving up to 15 test set-ups and 238 trace results for later review and archiving. Worldwide systems supported include all VHF & UHF Pu ...more

The T5588 meets such market demands with a maximum testing rate of 800 Mbps and by allowing the simultaneous testing of up to 512 devices. This enables high throughput testing at greatly reduced costs. T5588 is also the first DRAM package tester to offer an optional flash memory test function, making it uniquely adaptable to changing market co ...more

The VTE-2408-16/160 160-Socket Secure Digital Card Cabinet Test System is a high performance, high volume manual production tester designed for testing and programming Flash memory modules. The system consists of a cabinet capable of housing 4 test racks, each containing up to 40 test sockets total. ...more

The T5377 Memory tester provides solutions for wafer test of DRAMs and package test of Flash memory. The system supports high-speed testing at speeds of up-to 143/286 MHz.  ...more

ArraytestMaker is an advanced embedded test, diagnosis and repair solution for SRAM, CAM and DRAM. ArraytestMaker prevents ICs containing faulty SRAM from reaching systems. The user can select one of five algorithms that are built-into ArraytestMaker. ...more

A bench top engineering cycling system. FLASH memory endurance cycling system used to characterize and qualify the write/erase cycling endurance of FLASH memory devices and to conduct functional testing of memory devices at extreme temperatures. ...more

A  production site that can flexibly manufacture small lots of diversified products is, therefore, critical. ADVANTEST?s Model T5372 memory tester, a compatible upgrade of our best-selling Model T5371, incorporates a broadened set of features and functions that allow customers to address their increasingly diverse manufacturing requirements. T ...more

The PMC850 analyzer provides a multitude of functions to help you analyze your system. - Capturing bus activity using sequential triggers and filters - Exerciser to perform memory, I\O and configuration cycles - Stimulus generation for hardware simulation - Target memory with addressable windows - Anomaly detection of protocol and t ...more

The T5761 memory test system answers these calls with significant reductions in test time, and with its 512-device parallel test capability, per-site architecture, Error Code Correction (ECC), and real-time test programming functionality, the system also affords greatly reduced test costs. ...more

The MS5205 test system can be expanded to 144 pin channels suitable for testing a broad range of memory types, from commodity FLASH, SRAM, and DRAM through synchronous devices like SBSRAMs and SDR/DDR SDRAMs. ...more

The VTE-2407-16/160 MultiMediaCard Cabinet Test System is a high performance, high volume manual production tester designed for testing and programming Flash memory modules. The system consists of a cabinet capable of housing 4 test racks, each containing up to 40 MMC test sockets total.Perform full parametric and functional tests on up to 160 ...more

FLASH memory endurance cycling system used to characterize and qualify the write/erase cycling endurance of FLASH memory devices and to conduct functional testing of memory devices at extreme temperatures. Highest installed base of any cycling system in the world. ...more

A gang parallel write/erase/verify FLASH memory endurance cycling system for engineering and characterization. Includes functional test and environmental stress capability. 3 independent environmental chambers. ...more

The IBM Microelectronics Test Solutions Center has: Teradyne J997 72 IO, 40 drive-only channels and 4 DUT capable; 2 systems.Mosaid MS4205 36 I/O, 32 Address, 32 Control, 4 Diff Clk. Advantest T5592 384 I/O, 288 drive-only channels. We also have memory test capabilities on the HP83000 and can perform SDRAM and SSRAM testing up to 200 MHz, incl ...more

Performs DC parametrics and functional tests. 10MHz pattern generator. Characterize flash memory cell current and MRAM magnetoresistive properties. Algorithmic Pattern Generator Packaged devices or wafer test. ...more

The VTE-2402-16/128 128-Socket USB 2.0 Memory Card Cabinet Test System is a high performance, high volume manual production tester designed for testing and programming Flash memory modules. The system consists of a cabinet capable of housing 4 test racks, each containing up to 32 test sockets total.  ...more

The T5587 is able to meet this demand with its enhanced flash memory testing function and high throughput, capable of a maximum testing rate of 400 Mbps and simultaneously testing up to 512 devices.  ...more

The T5593 lowers the cost of at-speed test by supporting up to 256 devices simultaneous testing, Hifix exchange only by a socket board unit, and a new high-throughput calibration technology. Moreover, yield improvement is realized in combination with our handlers with Thermal Compensation Technology. This tester and handler combination is the ...more

The CPCI850 analyzer provides a multitude of functions to help you analyze your system. - Capturing bus activity using sequential triggers and filters - Exerciser to perform memory, I\O and configuration cycles - Stimulus generation for hardware simulation - Target memory with addressable windows - Anomaly detection of protocol and ...more

NTS600 Series Multi Site Flash Memory Test System. The NTS600 Series is a low cost 1 site to 64 site flash memory production wafersort and post- assembly test system. The system performs DC and functional tests on non-volatile memory devices. Novtek's unique architecture incorporates two pattern generators. The system consists of a software base ...more

The VTE-2102-8 8-Socket USB 2.0 Mass Storage Memory Card Portable Test System is one of several new high throughput manual testers produced by TESTMETRIX specifically designed for testing and duplicating USB Memory Cards. This MMC production test system is suitable for manual operation in low volume production environments. ...more

The T5383 provides a timely response to these trends. From front-end test for DRAM to back-end test for FLASH memory, MCP/SIP, and other devices, the T5383 provides a high-throughput solution that offers flexible support for increasingly fast and versatile memory devices. In addition, T5383 high-density pin electronics deliver 50% more capacit ...more