PW-5000 / MINI - Power Supply Automatic Inspection System PW-5000/MINI is a small sized power supply inspection system. The operation of the software is compatible to that of PW-600E Automatic Inspection System so existing customers can use this system smoothly.

WAOI Master 3000 - Wafer Probe Mark Inspection System This system is optical inspection system which inspects the pad marking and ink marking of Wafer surface automatically. This inspection system is composed of the wafer cassette part, wafer loading/unloading part, high magnification vision align part, inspection control part and inspection vision part.

Vela Laminate - Inspection System The VELA laminate inspection system is designed as a final control of the complete laminates and is thus located after the laminator.

01-9900-03-01 BL - Brick Inspection System This Brick Inspection System (BIS) has been completely re-designed and is based on the latest Black Label Technology by ATMvision AG.

TeraScanHR - Reticle Inspection System The TeraScanHR Reticle Defect Inspection System provides powerful technology and productivity features that enable the production of defect free reticles for 45nm. The new defect inspection system includes higher resolution optical imaging for a smaller pixel size, new capabilities for inspecting aggressive Optical Proximity Correction (OPC), and higher speed image processing to improve productivity

WIS 6000 - Wafer Inspection System Macro / micro wafer inspection system for 200 and 300mm wafers. Auto conversion between 200 & 300mm wafers with recipe. FOUP, FOSB & open cassette (std 1 ports with 2nd load port as optional). Easily upgradeable to become wafer sorter station. Uses reliable robotic arm. Wafer mapping up/down loading from central wafer mapping system & editing (optional).

Falcon 500 - Advanced optical inspection systems Camtek's Falcon 500 line of advanced optical inspection systems handles wafers before or after electrical / functional test. Designed to ensure known-good die, the Falcon 500 consistently detects visible defects that may impact die integrity or interconnect reliability.

IS3000 - Dark Field Wafer Defect Inspection System Dark field wafer inspection system for 45 nm generation
Effective for yield enhancement by the high sensitivity / high speed inspection capabilities. Superior cost effective inspection tool. DFC (Dark field real time classification)
Recipe set up in minutes. Precise coordinate system for SEM review.

112A/112B - Automatic Meter Inspection Systems 112A: The automatic meter inspection system 112A, which is the most appropriate for the inspection of remote watt-hour meters, 12B: The automatic meter inspection system 112B collects watt-hour meter signals and sends the data to personal computers through a two-wire circuit.

AITTFH - In-Line Pattern Wafer Defect Inspection System offers exceptional sensitivity and throughput needed by today's advanced thin film head manufacturing fabs for a broad range of patterned wafer tool monitoring applications, including deposition, CMP, critical etch, and photo modules.

Falcon 500 PD - Wafer inspection systems Post-dicing inspection offers the last opportunity to capture defects from preceding processes while the dice are still packed in wafer format. Camtek's Falcon 500PD line of automatic framed wafer inspection systems delivers superb detection of surface and probe mark defects, bump size and placement deviations, as well as dicing-related defects.

SMX-1000/1000L - Microfocus X-Ray Inspection System Compact, easy-to-operate, high-functionality X-ray inspection system. Both the SMX-1000 and SMX-1000L provide high-magnification nondestructive fluoroscopic examinations of junction conditions (disconnect, contact) of ultra-micro parts on high-density PCBs, BGAs, CSPs, or system LSIs.

Tire-X 3000 - X-Ray Inspection System for Truck and Bus Tires The Tire-X 3000 is an automated x-ray system for bus and truck tire inspection. Tire-X 3000 is designed to identify foreign materials, body ply cords, chafer dimensions, bad splices, and belt step offs. This system, which delivers a superior tire image, also offers automatic detection of certain tire defects.

US-1779 - Tie Bolt Inspection System The Tie Bolt Inspection System US-1779 employs eddy current technology for nondestructive testing of tie bolts used in aircraft wheels. Now in use by commercial and military aircraft. The system can test the threads as well as the underside of the bolt head. The system includes the UniWest's US-454A eddy current instrument, the UniWest Tie Bolt Scanner (US-1779), and specialty probe US-1839. The specialty probe detects flaws in both steel and inconel bolts.

microINSPECT - Manual Inspection System The MicroINSPECT™ wafer inspection system integrates more applications with ergonomic ease of operation. A small footprint, high speed, low cost per feature and serviceability contribute to its' award winning CoO.

X-eye 5000 Series - X-ray inspection system for PCBA/SMD and Electronic Components X-eye 5000 Series provide a superior X-ray inspection solution to reduce costs and increase throughput. Equipped a micro-focus X-ray tube, X-eye 5000 series provide high-quality X-ray image with ease of use. The system comes with auto-teaching (CNC programming) along with Auto BGA Inspection module.

Y.COUGAR VXP - 2D & 3D Microfocus X-ray Inspection System Designed to meet a wide range of rigorous needs of the electronics, automotive, military and aerospace, telecom and medical device markets, the compact Y.Cougar microfocus platform provides the most versatile X-ray solution for 2D and 3D inspection in the market.

Optistation-3200 - Wafer Inspection System One of Nikon's most advanced and versatile semiconductor inspection systems, the Optistation 3200 provides three-mode macro inspection capability – front, backside center, and backside perimeter – as well as high performance lighting techniques that allow for detection of a wide variety of process defects and particle/scratch detection.

X-SCOPE 1800 - Cabinet X-Ray Inspection System A 2"x2" digital flat panel x-ray detector
90 kV- 5 micron x ray tube
Z axis movement of the x-ray tube
Computer controlled kV and mA settings
Computer controlled variable speed X-Y stage
Full featured Image processing CPU with 19 inch LCD flat panel monitor
70 degree tilting tube and detector

AFIS jr - Automated Repeatable Fiberoptic Inspection System The AFIS jr is a machine vision fiberoptic connector analysis system that will detect fiber defects such as scratches, pits, and epoxy rings.

03-001-13-00 - Cell inspection system Solar cell 3D- Bow measurement The ATM 3D- Bow inspection system is a fast, non-contact technology and very small and easy to use system to detect defects in cells for solar production application.

LS6800 - Wafer Surface Inspection System LS6800 are capable of detecting smaller than 40 nm defects on unpatterned wafers with high sensitivity and throughput. Those tools support yield enhancement through high precision discrimination and detection of COP defects, particles, CMP scratches and particles.

TD-6A - Solder Paste Print Inspection System Automated table-top inspection system for measuring paste height, area, volume, and misprinting.