Inspection Systems

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  • phoenix nanome|x - Nanofocus X-ray Inspection System The phoenix nanome|x is an ultra high-resolution nanofocus X-ray inspection system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. The system offers excellent performance and versatility and can be used for 2D X-ray inspection as well as for full 3D computed tomography (nano ct).
    GE Measurement &
  • JewelBox 90T - X-ray Inspection System The Jewel Box 90-T delivers precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and pincushioning prevalent in other systems. Glenbrook?s patented, award-winning MXRA® x-ray camera technology.
    Glenbrook Technologies
  • AITTFH - In-Line Pattern Wafer Defect Inspection System offers exceptional sensitivity and throughput needed by today's advanced thin film head manufacturing fabs for a broad range of patterned wafer tool monitoring applications, including deposition, CMP, critical etch, and photo modules.
  • ERSASCOPE 1 - Inspection System USB 2.0 WVGA Digital Camera High Resolution, 90° BGA Optical Lens (≤ 300 µm) Halogen Light Source; long life bulb Light Management with flexible arm and optional accessories: fiber optic light brush & fan; mechanical iris adapter Flexible & ESD safe stand and table allows for a total of 7 axes of movement of optics and PCB ImageDoc Basic Software with Large Database of Problems & Solutions "Plug & Play" set up
    Kurtz Ersa
  • TruView X-Ray Elite - X-ray Inspection System The TruView X-Ray Elite is the high-end system in the TruView product line. The TruView Elite was design to meet your stringent requirements when performing process control, failure analysis, BGA inspection, and counterfeit detection.
    Creative Electron
  • NS7000 Series - Disk Surface Inspection System Ideal for defect analysis in the surface of substrate and disks. A high-precision surface inspection system for substrate and disk featuring a sophisticated defect classification function by laser irradiation of multi dearing and newly developed incline defect method.
    Hitachi High-Technologies
  • 7970 CMOS - Image Sensor Inspection System Chroma 7970 CIS Inspection System is a tray-based automatic inspection system to detect cosmetic defect on the both side of CMOS image sensor.
    Combinova Marketing
  • Purpose-built system configurations to match specific inspection requirements When there is no X-ray and CT system available that suits your organization's specific requirements, Nikon Metrology can develop a purpose-built system. CT specialists from Nikon Metrology build complete systems, configured with customer-specific inspection cabinet, manipulator, detectors, software features, etc.
    Nikon Instruments
  • 07-9900-00-00 - Module Inspection System The Module Inspection System (MIS) is designed to inspect photovoltaic modules with lastest image processing technology. Inline or offline, manual or fully automated, module manufacturer won´t want to miss features like image processing with quality classification, barcode scanning and archival storage. The inline integration to the module production line and the fully automated loading and module transport functionality are options to increase the throughput significantly.
    ATMvision AG
  • ULTRAPROBE 100 - Analog Ultrasonic Inspection System The Ultraprobe senses high frequency sounds produced by operating equipment, leaks and electrical discharges. It electronically translates these signals by heterodyning them down into the audible range so that a user can hear these sounds through a headset and see them as intensity increments on the meter. Heterodyning works the same as a radio in that it accurately transforms the sounds so that they are easily recognized and understood.
    UE Systems
  • X3 3D X-Ray - Automated In-line X-Ray Inspection System Nordson YESTECH's versatile X3 Automated X-Ray Inspection Systems (AXI) offers complete inspection of solder joints and other critical hidden features found in electronic assemblies, PCBs and packaged semiconductors. Ideal for in-line or off-line operation, the X3's innovative algorithms enable fast and reliable automated inspection and real-time monitoring of critical process information.
  • KY8030-2 - Dual Projection 3D In-Line Solder Inspection System The new KY8030-2 delivers 2x faster inspection without compromising performance and accuracy. Using patented dual projection, the system eliminates the critical Shadow problem that all 3D SPI systems can be vulnerable to. Easy UI and SPC Plus are included in the system package in order to help users achieve faster & easier printer process optimization
    Koh Young Technology
  • RTX-113HV - X-ray Inspection System A high performance real-time X-ray inspection system designed for inspection of multi-layer, assembled printed circuit boards, with dense metal BGAs, and recommended for lead free inspection requirements. Our RTX-113HV system meets all your needs for inspecting BGA packages.
    Glenbrook Technologies
  • Falcon 500 - Advanced optical inspection systems Camtek's Falcon 500 line of advanced optical inspection systems handles wafers before or after electrical / functional test. Designed to ensure known-good die, the Falcon 500 consistently detects visible defects that may impact die integrity or interconnect reliability.
    Camtek Intelligent
  • Standalone Type - US Inspection System The world's only system able to perform high-speed measurement of refractive index anisotropy of alignment layer film. Evaluation and measurement of various optical anisotropy parameters.
    Moritex USA
  • WIS - Wafer Inspection System Our Wafer Inspection System – WIS - carries out a fully automated inspection of mono- and polycrystalline silicon wafers. The modular design of the system means that individual configuration with the latest inspection technologies as well as smooth integration into your product lines is possible.
    Jonas & Redmann
  • Model 3710-HS - Solar Wafer Inspection System Integrated with 2D Geometry, Surface, Micro Crack, Saw mark inspection system and Resistively & Thickness, Lifetime tester by customer defined, Chroma 3710HS is a fully user configuration wafer sorter system with very low breakage rate and high through put.
    Chroma ATE
  • 03-001-13-00 - Cell inspection system Solar cell 3D- Bow measurement The ATM 3D- Bow inspection system is a fast, non-contact technology and very small and easy to use system to detect defects in cells for solar production application.
    ATMvision AG
  • BGA & PCB - Inspection Systems BGA inspection (Ball Grid Array Inspection) is necessary to detect and isolate process defects between a chip and circuit board. PCB Inspection (Printed Circuit Board Inspection) or SMT Inspection (Surface Mount Technology Inspection) is necessary to detect and isolate process defects on the top of a circuit board. Both BGA inspection and PCB inspection look for a variety of defects during process development or the quality process.
    EasyBraid Co
  • FyrEye-4000 - Family Circuit Board Inspection System Machine Vision System provides the benefits of reduced cost with 24/7 operation. Also reduces the instance of defective products slipping through human inspection.
    FSI Technologies
  • 03-0001-02-04 - Cell front side inspection system FS print and color The ATM FS- print inspection system is a fast, non-contact technology and very small and easy to use system to detect defects in cells for solar production application.
    ATMvision AG
  • WAOI Master 4000 - CMOS Wafer Inspection System This system is an optical inspection system which inspects the particles on the surface of CMOS Wafer, surface scratch defect, pad marking, ink marking or dead pixel automatically.
    Synapse Imaging Co
  • FyrEyeP 3600 - Tablet, Capsule, and Pill Inspection Systems Inspects tablets, capsules and pills. Designed for high-speed, continuous linear production process.
    FSI Technologies
  • WIS 8000 - Wafer Inspection System Macro / micro wafer inspection system for 200 and 300mm wafers. Auto conversion between 200 & 300mm wafers with recipe. FOUP, FOSB & open cassette (std 2 ports with 3rd load port as optional). Easily upgradeable to become wafer sorter station. Uses reliable robotic arm. Wafer mapping up/down loading from central wafer mapping system & editing.

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