Optistation-3200 - Wafer Inspection System One of Nikon's most advanced and versatile semiconductor inspection systems, the Optistation 3200 provides three-mode macro inspection capability – front, backside center, and backside perimeter – as well as high performance lighting techniques that allow for detection of a wide variety of process defects and particle/scratch detection.

XT V 160 - high-quality PCB inspection system The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control the 5-axis sample manipulator. Real-time X-ray allows them to intuitively navigate complex printed circuit boards and electronic components and quickly trace defects. In automated inspection mode, samples can be inspected at highest throughput.

VideoMic VSA - Video Inspection and Measurement System The VideoMic VSA split-axis series provides rapid, non-contact 3-axis coordinate measurement with increased accuracy. This capability allows the user to verify critical dimensions on first articles, production samples, or entire runs. With toleranced reporting, thresholds can be set to enable timely corrections to the process or, when necessary, interruption of production to minimize scrap.

GEN3000T - Chip Inspection System The system memorizes the characteristics of several good chips and creates a statistical image including process variations. By comparing the statistical image and the image of the item to be inspected, the algorithm helps to reduce false defects and enables automatic inspections as visual checks for accuracy. The defect inspection algorithm has a proven track record in our INSPECTRA, wafer defect inspection system.

03-0000-01-01 - Cell front side inspection system- on the fly FS- print The ATM FS- print inspection system is a fast, non-contact technology and a system very small and easy to use. It detects defects in cells for the solar production application.

NIR-01 - Silicon Inspection System The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.

ZIII - Micro Inspection System Inspection and Measuring Microscope The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.

VFI-200 - Interferometric inspection system for fibers with diameters of 125µm The VFI-200 performs much the same tasks as the VFI-1200 BUT it is optimised for the inspection of 125 µm diameter fibers. If you only need to look at telecom type fibers this is the unit for you as it's high native resolution makes it the highest magniifcation interferometer around.

X-SCOPE 2000/2300 - X-Ray Inspection Systems The X-Scope 2000 series is a general purpose, high resolution, fully programmable x-ray system designed to address the nondestructive testing needs for failure analysis, research and development, process development, process monitoring and the ongoing support of electronics assembly, rework and repair.

01-9900-03-01 BL - Brick Inspection System This Brick Inspection System (BIS) has been completely re-designed and is based on the latest Black Label Technology by ATMvision AG.

X-eye 5000BTS - X-ray Inspection System for PCBA/SMD and Electronic Components X-eye 5000BTS is a high-performance X-ray Inspection system for general non-destructive testing and failure analysis. With 90kV micro-focus closed tube equipped, X-eye 5000BTS provides high quality X-ray image with 5 micro focal spot size.

Candela 6300 Series - Topography Metrology and Defect Inspection Systems The Candela 6300 series delivers best-in-class metrology and inspection capabilities for data storage substrates and finished media. The 6300 series leverages the industry's widest spatial bandwidth coverage (from 0.22 microns to 2,000 microns) and a noise floor below 0.5 angstroms to satisfy emerging requirements for comprehensive roughness and micro-waviness measurements.

GlassChek - X-ray Inspection System, Dual Beam The GlassChek x-ray inspection system is a dual beam x-ray system that detects foreign bodies like glass shards in glass jars and can simultaneously ensure product integrity for a wide range of glass containers. The variations in thickness and shape inherent in glass jars prove to be no problem for the GlassChek x-ray system.

WIS - Wafer Inspection System Our Wafer Inspection System – WIS - carries out a fully automated inspection of mono- and polycrystalline silicon wafers. The modular design of the system means that individual configuration with the latest inspection technologies as well as smooth integration into your product lines is possible.

AFIS - Automated Inspection System for Fiber Optic Connectors The AFIS has the ability to inspect up to 60 connectors at a time without the need for someone to visually inspect each connector.

Vertex Series-A - X-Ray Inspection System The VJ Electronix Vertex Series – A is a versatile, all-purpose system with a large (20" x 24") inspection area and configuration flexibility for manual and automatic X-Ray examination. Designed to reveal hidden defects in Electonic Components and Assemblies, injection moulded Parts and other Non-Destructive Testing Applications.

NM 3625B - Flight Inspection System The Normarc single-console MiniFIS is designed especially with multi-mission aircraft in mind. A MiniFIS weighs less than an average adult passenger and only occupies one seat position. Once installed, the MiniFIS can be removed from any aircraft in less than 30 minutes and re-deployed in about the same time, thanks to the modular building-block construction and unique peg-lock system.

ScanINSPECT BPI - Inspection System ScanINSPECT provides a simple and user-friendly alternative to inaccurate and time-consuming manual inspection methods or expensive high-end AOI systems. ScanINSPECT uses a simple Windows user interface integrated with an image-processing unit. This combination allows 100% inspection of ball or bump placement on a wide variety of substrates and device types.

X-SCOPE 1800 - Cabinet X-Ray Inspection System A 2"x2" digital flat panel x-ray detector
90 kV- 5 micron x ray tube
Z axis movement of the x-ray tube
Computer controlled kV and mA settings
Computer controlled variable speed X-Y stage
Full featured Image processing CPU with 19 inch LCD flat panel monitor
70 degree tilting tube and detector

SPI HS60 - Solder Paste Inspection System The most reliable and accurate 3D data Our innovative 3D laser triangulation sensor, RSC profiles exactly real shape of features and also provides very robust 3D data against considerable variations of PCB color and finishing condition, solder material, paste shape, and warpage.

FyrEyeP 2800 - Printing and Finish Inspection Systems Inspects printed products for a wide range or printing, binding and assembly related defects and attributes.

SmartChek - X-ray Inspection Systems, Unwanted contaminants The SmarChek x-ray inspection system simultaneously detects and rejects unwanted contaminants, regardless of their shape or location within bulk food products. Any contaminants are quickly eliminated through a single or multi-flap rejection system (maximum 8 reject channels possible), minimizing waste and improving productivity.

FOCIS-210 - FOCIS PRO Fiber Optic Connector Inspection System - Automatic analysis of fiber end-face cleanliness and integrity
- Built-in IEC 61300-3-35, AT&T-TP-76461, and user defined limits
- Superb handheld ergonomics
- 1.3 μm/pixel analysis resolution
- 0.5 μm visual detection capability
- 1.0 μm optical system resolution
- 400 μm x 350 μm field of view
- Paired fiber images for before/after, input/output, etc
- Integrated focus and snapshot controls
- Capture, save, review and share images

Fiber Inspection, connector inspection, end face, end-face inspection, fiberscope, fiber scope, microscope
Excellent for use with WFW fiber wipes, Kimwipes, and other optical wipes to clean fiber endface, fiber end face. Perfect for use with Fujikura Fusion Splicer, AFL FAST Connectors, FuseConnect Fusion Spliced Field Terminated Connectors, NOYES fiber optic test equipment, fibre connector inspection, optical power meters, laser sources, and OTDR, connectors SC, FC, ST, LC, MU, MPO, MTP, Sticklers
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