Inspection Systems

The CS-100 X-Ray system provides ultra high-resolution images at magnifications up to 400 times and X-Ray tube resolutions down to 5 micron. The X-Ray source and X-Ray detector manipulation allows for a large variety of magnifications and field of views. ...more

In-Line High-speed Automatic Optical Inspection (AOI) System with Dual CCD Color Cameras ...more

The Mark 2000 Series of Real-Time X-Ray Evaluation Systems are designed for practical day-to-day use in industrial production settings. The Mark 2000 is a dependable and affordable Real-Time X-Ray Evaluation System for inspection of Aluminum Die Castings, Ceramics, Complicated Assemblies and Encapsulated Components. ...more

ESV-304 is a cost-effective AOI system, with either one or two CCD color cameras. The duel camera version uses two different resolutions (16mm and 8mm), so the ESV-304 can magnify small features when needed, yet speed through areas with larger components and pitches. The ESV-304 can inspect for missing, reversed, upside down, skew, tombstone, billb ...more

Fiberscope Inspection tool with built-in light source. High resolution image bundle and optical system. Easy to use eyepiece and handle. Focus adjustment. Bright light to illuminate viewed object. 48" Flexible gooseneck retains configured shape ...more

Specifically designed for home inspection professionals. Aids in identification of moisture, HVAC, electrical and hot water system issues. Kit includes: MO280 Pinless Moisture Meter, 42500 Mini IR Thermometer, ET10 GFCI Receptacle Tester, 39240 Waterproof Stem thermometer. ...more

IOtech?s eZ-NDT (non-destructive test) systems provide a fast and inexpensive method of 100% inspection of production parts, such as powder metal, ceramics, and composites. ...more

The Model 8030 Chatter Test System from Circuit Equipment Corporation is a versatile unit, which automates the inspection and characterization of relays. The system, controlled by an internal PC and menu-driven software, tests to the requirements of MIL-PRF-83536 and MIL-PRF-39016. It tests the complete Vibration, Shock and Acceleration speci ...more

Ideal for defect analysis in the surface of substrate and disks. A high-precision surface inspection system for substrate and disk featuring a sophisticated defect classification function by laser irradiation of multi dearing and newly developed incline defect method. ...more

ScanINSPECT SPI provides a simple and user-friendly alternative to inaccurate and time-consuming manual inspection methods or expensive, high-end AOI systems. ScanINSPECT SPI uses a simple Windows user interface integrated with an automatic conveyor and image-processing unit. This combination allows 100% inspection of printed solder paste ...more

Advanced Printed Circuit Board Inspection System ...more

The new Hirox BGA inspection lens, the MX-BGAZ, in the newest member of the Hirox Hi-Scope video microscope lens family, providing users the most flexible method for performing visual inspection of BGA components, including Micro BGA's. The BGA inspection lens can be used with any Hi-Scope camera and lighting main units, providing high-resolution i ...more

Transform your PC into a complete automotive diagnostic system with the EASE PC Scan Tool. View and graph live data such as RPM, MPH, throttle position, coolant temperature and oxygen sensor values, Retrieve and clear trouble codes and descriptions. Reset the Check Engine Lamp (MIL). Read and Clear Inspection and Maintenance Readiness Monitors. Use ...more

Dark field wafer inspection system for 45 nm generation Effective for yield enhancement by the high sensitivity / high speed inspection capabilities. Superior cost effective inspection tool. DFC (Dark field real time classification) Recipe set up in minutes. Precise coordinate system for SEM review. ...more

The Model 8025, Run-In/Miss Test System from Circuit Equipment Corporation is a versatile unit, which automates the inspection and characterization of relays. The system, controlled by an internal PC and menu-driven software, tests to the requirements of MIL-PRF-83536A and MIL-PRF-39016. It tests the complete Run-in Screening (miss), pull-in a ...more

An inspection equipment for 4th generation glass substrate. An original detection optics achieve high sensitivities. This equipment also features accurate front and back surface separate detection, a video monitor for particle review, and a high throughput for substrate. ...more

The X-Strobe Series is an advanced machine vision illumination strobe system. It's high output, long life, small size and superior reliability combine to make the X-Series the most versatile fiber optic stroboscopes available. These products incorporate the latest innovations in Xenon flashlamp technology, Power supply engineering, trigger per ...more

The Model 7010B Relay Life Tester automates the inspection and characterization of relays. The system is controlled by an embedded PC and menu-driven software. It has the capability to test up to 24 contacts in accordance with MIL-R-39016D specifications. Test results are compared with user defined limits and a final report is generated The repo ...more

ScanINSPECT provides a simple and user-friendly alternative to inaccurate and time-consuming manual inspection methods or expensive, high-end AOI systems. ScanINSPECT uses a simple Windows user interface integrated with an automatic table and image-processing unit. This combination allows 100% inspection of adhesive placement on PCBs after disp ...more

Start performing emissions inspections on 1996 and newer cars with the Certified EASE PAS System. Over two thirds of the total cars on the road in PA are 1996 and newer. Not sure how you can add even more time to your busy shop schedule to do this? Look no further than the Certified EASE PAS System. With the EASE wireless upgrade you can perform e ...more

The revolutionary FINN System is a miniaturized, fixture-mounted, software driven optical sensor for automated LED color verification. Its low cost simplicity, automated operation, and astonishing ease of fixture installation make the FINN the ideal alternative to risky, time-consuming manual inspection or cumbersome add-on testing equipment. ...more

High speed and high sensitivity EB wafer inspection system for 45 nm and beyond. New electron optics and advanced image processing system have realized high speed and high sensitivity inspection as well as excellent measurement repeatability with enhanced VC (Voltage Contrast). Real-time Automatic Defect Classification function is also available. ...more

Ideal for defect analysis in the surface of substrate and disks. The sophisticated classify defect can be detected by the develop and evaluation disk surface inspection system that measure at a same spindle by optical interference, laser irradiation of multi bearing and newly developed incline defect method. ...more

SBP (Solder Ball Placement) is equipped with the flexibility to attach solder balls on PBGA, singulated BGA and array BGA packages. Capable of handling solder ball size of 0.2mm at 0.4m pitch. Substrate vision alignment system. Proprietary positive ball handling mechanism. Vision inspection to check for missing/ double/ offset/. oversize/ unde ...more

The WM-Series of waveguide single ended mixers covers 75 - 325 GHz in six standard waveguide bands. They incorporate specially tailored GaAs Schottky barrier 'Mott' diodes manufactured by FTL. These mixers are available in fixed-tuned or tunable versions. An integral dc bias tee is standard for convenient system integration. All components are ...more