Focused Ion Beam

This surface analytical technique, which is similar to SEM/EDX, provides the concentration and distribution of the major elements, except H and He, on conductive surfaces. As in SEM/EDX , a focused beam of electrons (1 to 25 KeV in energy) excites atoms on a solid surface by generating core holes, but instead of x-rays, the detected particles are e ...more

Focused Ion Beam (FIB) systems can be employed to make precision modifications to a variety of samples. These modifications can be as simple as a single probe hole to metal 1, or as complex as a three-dimensional cross-section of a circuit ...more

Racal Instruments 1260-X138 is a high-density scanner/multiplexer switch card for use in a 1260-100X VXI Carrier. This plug-in provides maximum flexibility to construct a wide range of scanner/multiplexer and matrix configurations under software control while maintaining excellent bandwidth and signal integrity. ...more

High-resolution electron microscopes (SEM/TEM) and focused ion beam systems (FIB) are sensitive to environmental stray fields. Passive µ-metal shielding is ineffective and restricts the accessibility to control elements of the column. ...more

FB-2100 is a Focused Ion Beam nano mechanical probing system. S)TEM/SEM specimen can be prepared with rapidity and accuracy. High milling rate with accelerating voltage up to 40kV. In-situ microsample extraction from specific site with Hitachi's patented "Micro-sampling" (optional accessory). ...more