Showing results: 1 - 15 of 80 items found.
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ELMA Electronic, Inc.
Flat front panels for subracks and enclosures | 1 to 9 U and 2 to 84 HP| solid or perforated
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ICS Electronics
* Pre-machined, single-slot wide flat front panel.* Fits virtually any VXI B and C-size board.* Ejectors pivot on mounting brackets that mount on the PC board.* Each kit includes front panel, ejector handles, two ejector face places with VXI and ICS logos, all hardware and assembly instructions.
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Chroma ATE Inc.
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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MX63 / MX63L -
Olympus Corp.
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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NC-600 -
NAPSON Corp.
*Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer*1 to 10 number of probe by sizes of glass is attachable*Glass collision prevention function*Continuous test data report to the host computer
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HORIBA, Ltd.
HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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Extron Electronics
Complete AV systems for classrooms with a wall mounted ultra short-throw projector or flat panel display.
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128 Series -
Frontier Semiconductor, Inc,
Bow and Global Film Stress Measurement.Non-contact full wafer stress mapping for semiconductor and flat panel application.Dual Laser Switching Technology.
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ams AG
Highly efficient LED drivers provide optimal performance in general lighting applications and in LED backlighting systems for large flat display panels.
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1542 -
Elcometer Limited
The Elcometer 1542 Cross Hatch Adhesion Tester is ideal for measuring the cross hatch adhesion of coatings up to 250µm (9.8mils) on flat surfaces and test panels.
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PIMACS CO., LTD.
PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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Onto Innovation
With steppers for advanced packaging and flat panel display technology, Onto Innovation's latest fleet will meet today's manufacturing challenges head on. Systems are designed to maximize throughput without limited resolution and overlay.
