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NI-DAQmx - Driver and Measurement Services Software Driver and Measurement Services Software - high-performance, multithreaded driver for Windows at the heart of NI measurement services software. Additional measurement services include Measurement & Automation Explorer (MAX), DAQ Assistant, and VI Logger Lite.
Reaction Torque Sensor (screw driver) - Miniature Screw Driver FUTEK?s Reaction Torque Sensor - Miniature Screw Driver offers a unique solution for Torque auditing applications. From its anodized aluminum housing, to its light weight, the TAT200 Reaction Torque Sensor - Miniature Screw Driver provides a great Torque measurement solution.
YL4001 - DC Current Source Precision measurement of resistance, DC current bias for semiconductor devices, High stability current driver for semiconductor.
YL4010-10 - DC Current Source Precision measurement of resistance, DC current bias for semiconductor devices, high stability current driver for semiconductor.
MLSSA - Acoustical Measurement System MLSSA is the industry standard loudspeaker measurement system and the MLSSA Speaker Parameter Option (SPO) is the industry standard for measuring the Thiele-Small parameters of loudspeaker drivers. MLSSA and SPO both include QC (Quality Control) PASS/FAIL functions for high-speed automated production line testing of loudspeakers and drivers.
LDX-3600 - High Power Laser Diode Drivers The LDX-3600 Series High Power Laser Diode Drivers are a family of high performance current sources designed specifically for controlling and testing high power laser diodes. Five family members provide output current from 10A up to 120A with a compliance voltage of up to 10V in CW or QCW modes. High setpoint accuracy, low output noise, and 4-wire voltage measurement make these drivers ideal for precision, high power laser diode L-I-V testing. A unique power display mode allows laser diode power to be set based on programmable slope efficiency and threshold current parameters. External output power monitoring is supported through an independent photodiode measurement circuit.
Qohm30 - Omni-directional Mid Frequency Sound Source Developed to exceed all standard requirements in accuracy and with extreme high levels for any application. Focussing on better high frequency measurements, the multiple driver technology allowes much higher high frequency levels and better directionality,
Electronic Test & Measurement Consulting LXI Compliance Testing, Electronic test instrument design and Test system design. IEEE 488, SCPI command sets, Non ASCII command sets, LAN protocols, IVI driver design, Instrument architecture,
Measurement throughput and speed optimization.
2307 - Serial Data Acquisition & Control Board Serial Data Acquisition and Control Board. Provides Analog I/O, Digital I/O, Relay Driver Outputs and Temperature Measurements. RS-232, RS-422 and RS-485 Serial I/O includes network address and network packet modes.
2367 - Serial Data Acquisition & Control Interface Serial Data Acquisition and Control Minibox. Provides Analog I/O, Digital I/O, Relay Driver Outputs and Temperature Measurements. RS-232 and RS-485 Serial interface provides GPIB functionality over a serial link.
SCN - 3D Scanning Vibrometer KLIPPEL developed a new Scanning Vibrometer (SCN) that performs a non-contact measurement of the mechanical vibration and the geometry data of cones, diaphragms, panels and enclosures. It summarizes our experiences collected in scanning of all kinds of transducers (microspeakers, tweeters, compression drivers, woofers and subwoofers).
RTSX - Rotary Torque Transducer For use with most hand tools, power tools or rotational measurement applications. Connects between the power tool and the joint. Monitors actual torque being applied from the driver to the fastener. Features an instant auto-recognition system of the RTSX connected to the PTT & LTT.
NI Measurement Hardware DDK The NI Measurement Hardware Driver Development Kit (DDK) provides development tools and a register-level programming interface for the development of custom driver software. The NI Measurement Hardware DDK is designed for OEM customers who are developing applications that require nonstandard OSs and provides access to the full device register map and offers examples for completing common measurement and control functions. The Measurement Hardware DDK works with a selection of multifunction, analog output, digital I/O, and counter/timer I/O devices. Standard phone and e-mail support are not available for NI Measurement Hardware DDK users.
NI Driver Software for Digital I/O National Instruments includes the robust, easy-to-use NI-DAQ driver software with its digital I/O and other DAQ device. It tightly integrates the full functionality of your digital I/O hardware to LabVIEW, Measurement Studio, C/C++, and Visual Basic. NI-DAQ implements a variety of digital I/O operations. High-performance features include multidevice synchronization, networked measurements, and DMA data management. Bundled with NI-DAQ, the Measurement & Automation Explorer utility simplifies hardware configuration with device test panels, interactive measurements, and scaled I/O channels.
TXP5000 - Series Photonic Test & Measurement Platform Available Plug and play modules include integrated laser drivers and TEC controllers, DWDM DFB laser sources, a tunable laser, and an advanced polarimetry control and measurement. All modules are interchangeable and can be integrated with LabVIEW™ and LabWindows™/CVI control. The TXP platform is operated and configured by a PC.
NI PCI-6731 - High-Speed Analog Output -- 1 MS/s, 16-Bit, 4 Channels 8 digital I/O lines; two 24-bit counters; digital triggering Onboard or external update clock RTSI bus for synchronization with DAQ, motion, and vision products NI-DAQmx driver with configuration utility to simplify configuration and measurements Superior integration: LabVIEW, LabWindows™/CVI, and Measurement Studio for VB and VS .NET
PM1A Rev1212 - RF meter and Wide Dynamic Range Field Strength Meter Although, the other project, PM3 and FC3 are hot favorite among radio amateurs for RF Measurement, I wanted something smaller & more economical for measurement of RF Signals accurately using an LED Driver LM3914 and Log amplifier AD8307.
NI PCI-6052E - 333 kS/s, 16-Bit, 16 Analog Input Multifunction DAQ Included NI-DAQmx driver software and additional measurement services FREE award-winning global services and support at ni.com/support LabWindows/CVI and Measurement Studio for Visual Basic and Visual Studio .NET coordination Consider NI M Series for 18-bit resolution, 625 kS/s, and lower costs with the PCI-6281.
NI PCI-6023E - 200 kS/s, 12-Bit, 16 Analog Input Multifunction DAQ LabVIEW, LabWindows/CVI, and Measurement Studio for Visual Basic and Visual Studio .NET integration 8 digital I/O lines, two 24-bit counters Included NI-DAQmx driver software and additional measurement services FREE award-winning global services and support at ni.com/support
Pressure Sensors At the heart of every Tekscan pressure measurement system is an ultra-thin, tactile pressure sensor. Every Tekscan sensor is comprised of numerous individual sensing elements, or sensels. The sensel density represents the total number of sensels per unit of area. In order to use Tekscan's pressure sensors, you must have a Tekscan pressure measurement system as well as the corresponding sensor map (software driver) for the sensor.
AP3000 - biconical antenna AP3000 is the evolution of AP2000 biconical dipole antenna. The device performs accurate RF radiation measurements from 80MHz to 3.0GHz. This small size antenna permits frequency selective E-field strength measurement in a wide frequency range. Total field is obtained combining the vector components (Ex, Ey, Ez). This can be done using the software package SW3000 (automatic spectrum analyser driver).
WaferPro Express - On-Wafer Measurement Program Software WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
NI PCI-6723 - Static and Waveform Analog Output -- 13-Bit, 32 Channels 800 kS/s per channel for one channel; 45 kS/s per channel for 32 channels Slew rate limited to 10 kHz full-scale sine wave Simultaneous update; onboard or external update clock RTSI bus for synchronization with DAQ, motion, and vision products NI-DAQmx driver with configuration utility to simplify configuration and measurements Superior integration: LabVIEW, LabWindows™/CVI, and Measurement Studio for VB and VS .NET
NI PXI-6723 - Static and Waveform Analog Output -- 13-Bit, 32 Channels 800 kS/s per channel for one channel; 45 kS/s per channel for 32 channels Slew rate limited to 10 kHz full-scale sine wave Simultaneous update; onboard or external update clock PXI trigger bus for synchronization with DAQ, motion, and vision products Superior integration: LabVIEW, LabWindows™/CVI, and Measurement Studio for VB and VS .NET NI-DAQmx driver with configuration utility to simplify configuration and measurements
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Drivers - translate general instructions into hardware specfic commands.
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