Driver and Measurement Services Software - high-performance, multithreaded driver for Windows at the heart of NI measurement services software. Additional measurement services include Measurement & Automation Explorer (MAX), DAQ Assistant, and VI Logger Lite.
FUTEK?s Reaction Torque Sensor - Miniature Screw Driver offers a unique solution for Torque auditing applications. From its anodized aluminum housing, to its light weight, the TAT200 Reaction Torque Sensor - Miniature Screw Driver provides a great Torque measurement solution.
National Instruments LabView driver for control C300 calibrator. It makes possible to set voltages, currents, angles, frequency, harmonics, reading analog inputs of C300 and also to make automatic test of electricity meter
MLSSA is the industry standard loudspeaker measurement system and the MLSSA Speaker Parameter Option (SPO) is the industry standard for measuring the Thiele-Small parameters of loudspeaker drivers. MLSSA and SPO both include QC (Quality Control) PASS/FAIL functions for high-speed automated production line testing of loudspeakers and drivers.
For use with most hand tools, power tools or rotational measurement applications.Connects between the power tool and the joint. Monitors actual torque being applied from the driver to the fastener.Features an instant auto-recognition system of the RTSX connected to the PTT & LTT.
LXI Compliance Testing, Electronic test instrument design and Test system design. IEEE 488, SCPI command sets, Non ASCII command sets, LAN protocols, IVI driver design, Instrument architecture, Measurement throughput and speed optimization.
Serial Data Acquisition and Control Board. Provides Analog I/O, Digital I/O, Relay Driver Outputs and Temperature Measurements. RS-232, RS-422 and RS-485 Serial I/O includes network address and network packet modes.
Serial Data Acquisition and Control Minibox. Provides Analog I/O, Digital I/O, Relay Driver Outputs and Temperature Measurements. RS-232 and RS-485 Serial interface provides GPIB functionality over a serial link.
The NI Measurement Hardware Driver Development Kit (DDK) provides development tools and a register-level programming interface for the development of custom driver software. The NI Measurement Hardware DDK is designed for OEM customers who are developing applications that require nonstandard OSs and provides access to the full device register map and offers examples for completing common measurement and control functions. The Measurement Hardware DDK works with a selection of multifunction, anal...
National Instruments includes the robust, easy-to-use NI-DAQ driver software with its digital I/O and other DAQ device. It tightly integrates the full functionality of your digital I/O hardware to LabVIEW, Measurement Studio, C/C++, and Visual Basic. NI-DAQ implements a variety of digital I/O operations. High-performance features include multidevice synchronization, networked measurements, and DMA data management. Bundled with NI-DAQ, the Measurement & Automation Explorer utility simplifies hard...
Although, the other project, PM3 and FC3 are hot favorite among radio amateurs for RF Measurement, I wanted something smaller & more economical for measurement of RF Signals accurately using an LED Driver LM3914 and Log amplifier AD8307.
AP3000 is the evolution of AP2000 biconical dipole antenna. The device performs accurate RF radiation measurements from 80MHz to 3.0GHz. This small size antenna permits frequency selective E-field strength measurement in a wide frequency range. Total field is obtained combining the vector components (Ex, Ey, Ez). This can be done using the software package SW3000 (automatic spectrum analyser driver).
TTL Pulse measurement channels (Timers / Counters) 18 Channels TTL Pulse Generation - 12 Channels The Pulse Generation Frequency from 10Hz to 40MHz The no. of pulses controlled from 1 to 255 pulses All Channels are compatible with 5V TTL / CMOS All the pulse input and the output signals driven through Pin Driver Standard ISA Bus Interface
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
Available Plug and play modules include integrated laser drivers and TEC controllers, DWDM DFB laser sources, a tunable laser, and an advanced polarimetry control and measurement. All modules are interchangeable and can be integrated with LabVIEW™ and LabWindows™/CVI control. The TXP platform is operated and configured by a PC.
Included NI-DAQmx driver software and additional measurement servicesFREE award-winning global services and support at ni.com/supportLabWindows/CVI and Measurement Studio for Visual Basic and Visual Studio .NET coordinationConsider NI M Series for 18-bit resolution, 625 kS/s, and lower costs with the PCI-6281.
8 digital I/O lines; two 24-bit counters; digital triggering Onboard or external update clock RTSI bus for synchronization with DAQ, motion, and vision products NI-DAQmx driver with configuration utility to simplify configuration and measurements Superior integration: LabVIEW, LabWindows™/CVI, and Measurement Studio for VB and VS .NET