DUT

The NPRT 2200 performs Noise Power Ratio measurements to determine the dynamic range of optical transmitters, amplifiers and other active devices used in HFC networks. It has an internal broadband noise source, selectable filters and a measuring receiver. ...more

The VTC120 Series Voltage Converter is a variable duty cycle switching power supply with a precision linear regulator output (except for the VTC120nr-12-24). This model is common negative. This means that the input negative (ground) connection and the output negative (ground) connection are common or tied together. Applications include running ...more

The single-channel Model 2302 Battery Simulator and dual-channel Model 2306 Battery/Charger Simulator were designed specifically for development and test applications of portable, battery-operated products, such as cellular and cordless telephones, mobile radios, and pagers. These precision power supplies have ultrafast transient response so t ...more

The Model 4200-PG2 dual-channel pulse generator is an option for the Model 4200-SCS semiconductor characterization system. This pulse generator produces voltage pulses as short as 10ns in high speed mode or up to $177;20V (into 50O) in high voltage mode. Two pulse generators on one card provides you with the flexibility to apply pulses to two ...more

VSWR : <1.7, 100MHz ~ 3GHz ; Shielding Effectiveness : > 80dB up to 2GHz, >70dB 2GHz ~ 3GHz ; Able to install DUT Rotator jig ; RF Connectors : N(f) outside, SMA(f) outside and SMA(f) inside ; Dimension : 344(W)×403(D)×675(H) mm . ...more

The MPT6000 tester is a multi-purpose tester, which can test nine different DUT (Device Under Testing) packaging configurations. The testing of reverse voltage is from 3V - 2000V and it can sort 11 Bins. In addition, the MPT6000 tester can be connected to a TRR (Reverse Recovery Time) emulator for sequential testing. Parameters such as RG1 TRR ...more

LitePoint Bluetooth Software Package provides manufacturing test capability for Bluetooth v1.1, v1.2, v2.0 and enhanced data rate (EDR) products using IQview or IQflex one-box test instruments. The package includes new API commands and integration of FM modulation support into IQsignal Software analysis package (IQview installations only). Blu ...more

VSWR : <1.7, 100MHz ~ 3GHz ; Shielding Effectiveness : > 80dB up to 2GHz, >70dB 2GHz ~ 3GHz ; Able to install DUT Rotator jig ; RF Connectors : N(f) outside, SMA(f) outside and SMA(f) inside ; Dimension : 344(W)×403(D)×675(H) mm . ...more

The HI-RES Vision System is an optical inspection instrument that could easily be employed either as stand alone unit or integrated in any test system assembly for the visual inspection of the DUT. ...more

The IBM Microelectronics Test Solutions Center has: Teradyne J997 72 IO, 40 drive-only channels and 4 DUT capable; 2 systems.Mosaid MS4205 36 I/O, 32 Address, 32 Control, 4 Diff Clk. Advantest T5592 384 I/O, 288 drive-only channels. We also have memory test capabilities on the HP83000 and can perform SDRAM and SSRAM testing up to 200 MHz, incl ...more

NTS600 Series Multi Site Flash Memory Test System. The NTS600 Series is a low cost 1 site to 64 site flash memory production wafersort and post- assembly test system. The system performs DC and functional tests on non-volatile memory devices. Novtek's unique architecture incorporates two pattern generators. The system consists of a software base ...more

VSWR : <1.7, 100MHz ~ 3GHz ; Shielding Effectiveness : > 80dB up to 2GHz, >70dB 2GHz ~ 3GHz ; Able to install DUT Rotator jig ; RF Connectors : N(f) outside, SMA(f) outside and SMA(f) inside ; Dimension : 344(W)×403(D)×675(H) mm . ...more

The use of automatic test systems for functional tests and final testing in the production of electronic products require a multitude of test DUT fixtures, power supplies and stimulating signals.  ...more

Cross Roller Series. Parkers 800CT Series Linear Tables employ a nonrecirculating cross roller bearing system to provide smooth linear translation of heavier loads in applications where mechanical disturbance cannot be tolerated. The 800CT is a rugged table rated at 100% duty cycle. It has a larger cross roller bearing system and an effic ...more

UHF Power Amplifiers, VD480L, applications. Data operation: 16-kbit operable eg for WBSV AM/FM baseband or diphase: VINSON KY-58 cipher unit compatible. Fixed-frequency and HAVE QUICK ECCM systems. Single and multichannel (broadband) application. Continuous operation (100% duty cycle) ...more

The 7720 Impulse Winding Tester uses a very high voltage impulse to stimulate the device under test (DUT).  It analyzes the decay waveform to detect changes in material, shorted and damaged windings and other errors.  Long term decay of a winding can also be detected. ...more

Packaged Ministepping Systems. Designed and manufactured in accordance with an ISO9001-approved Quality Management System. Recirculatory current control reduces drive and motor heating and increases motor duty cycle performance. Four selectable motor resolutions between 400 and 4,000 step/rev ...more

VHF Power Amplifiers VU220L. Control interfaces for Series 200, 400U or M3SR transmitters. Use in radio systems with DC backup supply. Continuous operation (100% duty cycle) under normal operating conditions. Linear amplifier operation together with other (non-Rohde & Schwarz) exciters ...more

The new programmable DC Power Supply NGPQ32/6 is a general purpose laboratory power supply, useable in all applications, where the quality of the supply voltage plays an important role for proper DUT operation. Due to its excellent output regulation characteristics, it is a suitable battery replacement of mobile communication products like mob ...more

The Micron Optics si425 is a complete, stand-alone, multi-sensor measurement system that provides a high optical power, rapid measurement rate up to 512 FBGs on four fibers. The si425 has been designed with an advanced laser capable of a maximum scan rate of 250 Hz and is expandable from 1 to 4 DUT channels. The user can choose scan frequencies ...more

TestEdge offers quick, cost effective test fixture design services for low-speed, full-speed, and high-speed devices. Based on our experience in developing high performance test fixtures for a wide variety of devices, test sockets, and tester platforms, we provide a premium quality test and engineering validation environment for everything from hig ...more

Matrix Modules - CPM and PAM provide fundamental flexibility to connect any instruments to any DUT pin. Relay matrixes of both modules are programmable, enabling safe connection of each module (any 8-pin combination) to the six analog instrumentation nodes. Each module is separately addressable, allowing multiple matrix modules per system, and ...more

To meet requirements for higher throughput testing, Probe 2000 has created a new type of probe card for testing state-of-the-art semiconductor devices. Developed in partnership with our customers, the Dual Die Shelf Card enables more efficient probing of a multidie DUT. Using a cantilever-style needle arrangement, the DDSC can simultaneously probe ...more

Programmable Pulse Generator - Provides four output pulses precisely related in time. Four independent generators designed to deliver high integrity pulses to the DUT without using specially designed probe cards. ±10V pulses, 50mA per generator; 200ns to 200s pulse widths. ...more

Scanner Module - Used by the RI-52 Metal Migration Analyzer to interface between the stress/test instrumentation and devices being monitored in a single experiment. Provides the connectivity from the stress current source to the series connected DUT string on the load boards (supports 1  32 DUT). ...more