Chucks
More Info| Related Searches: | Positioning, Probe Stations, Wafer Handlers, Wafer Probers, Wafer Probes |
|---|
-
Artic TC3800 - Temperature Controlled Chucks TRIO-TECH International Contact Info Send To Colleague
The new Artic TC3800 has been developed to meet the demanding requirements of 200 mm wafer production probing applications. The unique design, for which patents are pending, offers exceptional mechanical strength for high probing forces while providing the convenience of a temperature controlled chuck with excellent temperature performance. Th ...more -
QuietCHUCK System Materials Development Corporation Contact Info Send To Colleague Basic Hot Chuck System: Complete set of components required for mobile ion measurements by conventional bias-temperature stress technique (CVBT) or triangular voltage sweep method (TVS) using the MDC QuietCHUCK DC Hot Chuck Controller. The CSM/WIN System can control and monitor all stress parameters. Multiplexing of up to 10 probes available. ...more -
Wafer Cooling Chillers Boc Edwards Contact Info Send To Colleague The BOC Edwards TCU 40/80 and TCU 40/80 Plus chillers are designed to meet the stringent requirements for the cooling of wafers during etch or other semiconductor processes. They are suited to all processes - typical applications include the cooling of electrostatic chucks, quartz windows, chamber domes and walls. Systems are available with di ...more -
Voltstik - Radio Based Distribution Voltmeters SensorLink Contact Info Send To Colleague The Voltstik is a distribution voltage voltmeter designed for use on lines and in substations. This meter is employed onto a line by using a hot stick and universal chuck adapter. It is capable of measuring voltage phase to phase, and phase to ground. This high impedance instrument is an excellent choice for solving multiple problems associated ...more -
Autoloading Hot Chuck Materials Development Corporation Contact Info Send To Colleague For multiple site measurements. Facilitates mapping of parameters like Vfb, lifetime, oxide integrity, or interface trap density. Special prober software includes expanded multiple test menus, data storage and statistical analyses. ...more -
V2002 Spinstand Automation for Media Testing Guzik Technical Enterprises Contact Info Send To Colleague The spinstand V2002 with the media-testing automation loads and unloads the cap of the vacuum chuck and moves the disk stabilizer shroud on and off media without operator's intervention. As a result, less time is required for a media replacement, so the same number of disks can be tested faster ...more -
DuoCHUCK System Materials Development Corporation Contact Info Send To Colleague The DuoCHUCK Integrated Hot Chuck System: Designed for high throughput CVBT mobile ion tests. Contains two hot chucks and all associated control, multiplexing, and stress bias circuitry to make measurements on one to five C-V dots on each chuck. The DuoCHUCK has 10 times the capacity of a conventional single dot probe station. ...more -
C-V PLOTTERS Materials Development Corporation Contact Info Send To Colleague MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or ...more -
SPM E-Z Articulated Chuck Semiconductor Products Mfg. Contact Info Send To Colleague Faster Kit Changeovers (replacement of nest without entire chuck removal) Reduced Downtime Lower Maintenance Costs Allowance for Contactor/Nest Misalignment ...more -
Vacuum Probe Systems SUSS MicroTec Test Systems GmbH Contact Info Send To Colleague Test your devices in a high vacuum (1 x 10-5 mbar). Specially designed thermal chucks for testing from -60°C to 200°C ...more -
PM500 Manual Probe System KARL SUSS Dresden GmbH Contact Info Send To Colleague With its built-in square chuck, the SUSS PM500 is the ideal probe system for failure analysis (FA) tests of flat panel displays (FPDs) up to 500 x 500 mm. Vacuum grooves in the standard and thermal chuck surface give you the freedom to test round wafers and substrates as well as square substrates with the same probe system. ...more -
P300A Semi-Automatic Probe Station The Micromanipulator Company Contact Info Send To Colleague The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing. ...more -
SSM Stage Mount The Micromanipulator Company Contact Info Send To Colleague The stage mounting collar (model SSM) is used to mount custom devices on the stage chuck post for 6000 and 6200 stations. ...more -
P300J Manual - Motorized 200 - 300 mm Probe Station The Micromanipulator Company Contact Info Send To Colleague The P300J probe station is the most stable, intuitive, and space efficient 300mm analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300J comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing. ...more -
TR812T Wafer Positioning Platform Newport Corporation Contact Info Send To Colleague Finished, fully integrated OEM platform with cable routing, vacuum lines and vacuum chuck. For point-to-point positioning with excellent repeatability, high reliability, in a small footprint ...more -
FPH Series Fiber Chucks and Holders Newport Corporation Contact Info Send To Colleague A selection of FPH Series Interchangeable Fiber Chucks and Holders are available to hold optical fibers in Newport Fiber Positioners and Couplers. Fibers can be removed and replaced repeatedly without damage, yet they are held securely. ...more -
R48/A Cascade Microtech, Inc. Contact Info Send To Colleague Gold-plated vacuum chuck surface ...more -
R4821 Cascade Microtech, Inc. Contact Info Send To Colleague REL-4821 8 in. Manual Probe Station, thermal, nickel-plated chuck ...more -
R4822 Cascade Microtech, Inc. Contact Info Send To Colleague REL-4822 8 in. Manual Probe Station, thermal, gold-plated chuck ...more -
R4821HT Cascade Microtech, Inc. Contact Info Send To Colleague REL-4821 8 in. Manual Probe Station, thermal, nickel-plated, high temperature chuck ...more -
R4822HT Cascade Microtech, Inc. Contact Info Send To Colleague REL-4822 8 in. Manual Probe Station, thermal, gold-plated, high temperature chuck ...more -
R4831 Cascade Microtech, Inc. Contact Info Send To Colleague REL-4831 8 in. Manual Probe Station, guarded thermal, nickel-plated chuck ...more -
R4832 Cascade Microtech, Inc. Contact Info Send To Colleague REL-4832 8 in. Manual Probe Station, guarded thermal, gold-plated chuck ...more -
R4831HT Cascade Microtech, Inc. Contact Info Send To Colleague REL-4831 8 in. Manual Probe Station, guarded thermal, nickel-plated high temperature chuck ...more -
R4832HT Cascade Microtech, Inc. Contact Info Send To Colleague REL-4832 8 in. Manual Probe Station, guarded thermal, gold-plated high temperature chuck ...more
|
Definition: Provide an electrically quiet enviroment for sensitive capacitance and current measurement of wafers. |