Atomic Force Microscopes

Dimension X automated atomic force microscopes (AFM) replace costly, destructive cross-sectioning techniques, reducing etch measurement turnaround from days to minutes. ...more

The BioScope™ II atomic force microscope (AFM) has been engineered specifically to facilitate advanced bioscience research. This remarkably versatile instrument enables AFM imaging under a broad range of dynamic and biologically relevant conditions. ...more

It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. ...more

The Electrochemical Atomic Force Microscope (ECAFM) allows nanometer-resolution AFM imaging of electrode surfaces in solution under electrochemical control. ...more

BioScope Atomic Force Microscope offers full atomic force microscopy on a high-power inverted optical microscope, thereby combining nondestructive scanning with familiar sample preparation, mounting, and optical capabilities. ...more

The Dimension 5000 Scanning Probe Microscope (SPM) provides the ultimate in automated large-sample capability for semiconductor and data storage device manufacturers, measuring up to one hundred areas on samples up to 350 mm in diameter. With the entire range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques a ...more

The Dimension 3100 Scanning Probe Microscope (SPM) utilizes automated atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200 mm in diameter. Its laser spot alignme ...more

Dimension X3D Automated Atomic Force Microscope is the first nondestructive, gauge-capable, automated metrology system to deliver three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. ...more

The Dimension Vx200/300 Atomic Force Profiler (AFP) combines the resolution of an atomic force microscope (AFM) with the long scan capability of a profiler to offer the highest performance profiling and atomic force microscopy available. It offers non-destructive profiling for CMP control and characterization and high aspect ratio depth measur ...more

The EnviroScope AFM combines modular environmental controls, a sealed hermetic sample chamber, and a wide range of imaging modes to bring superior application flexibility to research and industrial facilities. ...more

The Dimension X3D-PM Atomic Force Microscope is the newest line of automated AFM metrology specifically designed for Photomask applications.  ...more

The NEW BioScope SZ Atomic Force Microscope offers full atomic force microscopy on a high-power inverted optical microscope. ...more

The di Dimension V scanning probe microscope utilizes atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter. Its laser spot alignment system and the abil ...more

Uses Scanning Near-Field Optical Microscopy (SNOM) to investigate optical properties beyond the conventional limits imposed by diffraction. NTEGRA Solaris combines three different microscopy techniques: light, scanning nearfield optical microscopy (SNOM), and atomic force microscopy (AFM). Integration at this advanced level creates enormous design ...more

The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally modular design approach which delivers unmatched versatility and utility. Patented Isotopic Focal System™ permits 90 degree top-down view for easy alignment and positioning of the probe as well as tracking of cantilever/probe during scanning for increased sensitivity and eli ...more

Response Dynamics provides a broad range of vibration and acoustical engineering consulting services to the semiconductor industry, the biotech industry and other high tech industries worldwide since 1984. We solve problems ranging from the nanometer level vibration issues on scanning electron microscopes, interferometers, and atomic force microsc ...more