ATE

Acculogic offers turn-key In-Circuit test program development and fixture fabrication services for a variety of Automatic Test Engineering (ATE) platforms. Our team of fully trained and experienced engineers consistently deliver advanced In-Circuit test programs with high fault coverage and quick turn-around times. Between them, Acculogic test engi ...more

TTCI supports several platforms for In-Circuit test set development: GenRad 228x & 227x series test systems and the Agilent (HP) 3070 series. All of our test programs are thoroughly Quality Checked before shipment. Additional services provided by Test Connection, Inc. are Testability and Design Reviews for board (ICT) test. ...more

FlashRunner is the first complete production In-System Programmer specifically designed for manufacturing lines. FlashRunner is small and robust enough to support engineering as a design tool, production as a programming tool and field returns as a tool to help update firmware from systems that were in the field. The FlashRunner currently has over ...more

Integrating Functional and In-Circuit Test Solutions .The InteFun2700 and functional test services offer industry proven components that build a functional test strategy for a broad range of manufacturing test applications. Designed for production testing, our solutions are optimized for reliability, throughput, repeatability and cost. The Int ...more

The fully programmable Model 1740 facilitates high speed, production line testing in both automated and manual applications. Standard tests include AC Hipot, DC Hipot, Resistance, patented Tang-Weld Resistance and Surge. Robust software offers automatic setup of all test parameters, complete result storage, Go/No-Go testing requiring no operat ...more

The Model NS-3 RF noise generater is full of features that make this signal source perfect for bench, field, and ATE test applications. The NS-3 generates a flat AWGN noise signal from 5 MHz to 2.15 GHz that is ideal for digital signal simulation, carrier to noise testing, interface testing and more. ...more

Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Map ...more

The Agilent 6813B is ideal for applications such as power supply testing, UPS testing, avionics ATE, the testing of power factor corrected equipment and devices. Set up is made easy with the Graphical User Interface, which requires no programming. And protect your valuable prototypes and assemblies with the extensive set of protection features. ...more

Agilent high performance DC power supplies offer speed and accuracy for test optimization. The single low-profile modular power system, 50-300 W, GPIB, LAN, USB, LXI Class C N6700B series provides small size up to 4 outputs in 1U of rack space; 20 DC power modules, basic, performance and precision models; as well as fast output programming with act ...more

Agilent high performance DC power supplies offer speed and accuracy for test optimization. The single low-profile modular power system, 50-300 W, GPIB, LAN, USB, LXI Class C N6700B series provides small size up to 4 outputs in 1U of rack space; 20 DC power modules, basic, performance and precision models; as well as fast output programming with act ...more

The ProDAQ Flexible Modular Data Acquisition System is designed to reduce the cost of developing and building Data Acquisition and ATE Systems. ProDAQs unique, high-density, modular system concept will significantly reduce the size and cost of VXIbus based Data Acquisition and ATE Systems by offering savings in the number of VXI modules and VX ...more

Our systems support analog, digital, electronic warfare, and radar--both line and shop replaceable units--across a variety of weapon system platforms, including the B-52, C-130, C-141, F-15 and F-16. A world-class workforce is available to provide upgrades, modifications and new instrumentation as the needs arise. Further detail is provided below o ...more

Sovtest ATE Ltd produces the Locators as commercial equipment and the devices are available at the finished-products storage area. ...more

The Power Measurement System consisting of an advanced 6630 Power Analyzer and a 6530 Series or other Chroma family AC Power Source is the ATE for Voltage and Current Harmonics test in compliance with IEC61000- 3-2, IEC61000-3-2 A14, and for Flicker test (voltage fluc-tuations) following the IEC 61000-3-3 international stan-dards. ...more

The QD-1020 is based on the QD-1010 technology and allows to arrange the monitors in a multisite configuration, thereby sharing ATE resources. Only three ATE channels are required to communicate with multiple monitors.  ...more

The Model 6451 Databridge component measurement instrument is an economically priced, automatic and microprocessor controlled LCR bridge with a basic accuracy of 0.1%. It's practical features, optional IEEE-488/RS232 interface and limits comparator make the LCR 6451 ideal for the laboratory as well as for applications in ATE systems. ...more

2 Wire Continuity Resistance Measurement.Short Circuit Detection. Insulation Test Voltages up to 500Vdc. Insulation Resistance Measurement up to 300M?. AC Dielectric Hi-Pot test up to 250Vac. ...more

Development of automated test systems and test program sets for field, intermediate, and depot level support. MTI’s Test Engineering department provides an in-depth, robust environment for Automatic Test System (ATS) and Test Program Set (TPS) development. MTI’s test engineering personnel have extensive experience in all aspects and engineering di ...more

The P400 is a benchtop digital delay and pulse generator that generates four separately programmable delay-and-width outputs. The P400 can generate delays up to 1000 seconds in 1ps increments, and is capable of a high repetition rate of 10MHz. Applications for the P400 include laser timing, ICCD camera systems, ATE systems, and radar testing. ...more

AB Controls provides customized automated test equipment solutions for a wide range of products and instruments including: electronics, laser, electromechanical, optical, semiconductor and chemical. Our portfolio of custom test equipment include: test systems for refrigeration units, laser systems, electronics and PC boards, actuators, winches, inf ...more

Integrated systems-on-a-chip (SOC), combining a wide variety of functions are complex devices and challenge to any device tester. This demanding mixture of digital, analog and power features call for a highly versatile ATE system. ...more

The QT-1410 advanced IDDT monitor is a fast and sensitive digital transient supply current (IDDT) monitor designed for ATE add-on application.  ...more

For fast field checks of various sensor types (inductive, capacitive, photoelectric and ultrasonic) 10 ... 30 V. ...more

The QD-2000 contains four configurable quiescent supply current (IDDQ) monitors, designed for ATE applications. All four modules can operate in parallel each providing a 16-bits digital measurement value. The QD-2000 monitors operate according to the Stabilised Voltage Drop principle and are designed to be inserted between the Automated Test E ...more

Our Series G2 product line has been introduced for a new millennium where demands for performance, quality and cost effective switching products are in high demand. Series G2 modules provide a flexible solution to most switching applications in the communications, ATE and broadcast industries. Solid-state, relay and digital products are offere ...more