MultiMode V
The di MultiMode V represents the next generation of the world's best-selling, most field-proven SPM. It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. A short mechanical path length between probe tip and sample provides very fast scan rates with the utmost precision.
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Veeco Instruments Inc
100 Sunnyside Boulevard
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