Dimension V Scanning Probe Microscope (SPM)
The di Dimension V scanning probe microscope utilizes atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter. Its laser spot alignment system and the ability to change scanning techniques without tools guarantee flexibility, ease of use, and high product throughput.
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Veeco Instruments Inc
100 Sunnyside Boulevard
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