XZIF
Zero Insertion Force interconnect (XZIF) is an innovative design solution to the challenges of high pin count semiconductor test interfacing that reduces total interface costs. A radical departure from traditional spring probe compliant connections and backplane connectors, the XZIF interconnect design utilizes cutting edge bump on flex technology to replace both spring probes and pin/socket connectors. Already selected by a leading ATE manufacturer for a next generation test system, XZIF offers significant cost savings over traditional interconnect systems and provides the higher densities and parallelism required by next generation ATE platforms.
|
Xandex, Inc.
1125 N. McDowell Blvd.
|
| Related Products |
-
025-16 series - Probes and Sockets QA Technology Company, Inc. Contact Info Send To Colleague 
The 025-16 series probes and sockets are designed for bare and loaded board testing. .025 (0.63) Centers - .160 (4.06) Stroke. ...more -
039-16 series - Probes and Sockets QA Technology Company, Inc. Contact Info Send To Colleague The 039-16 series probes and sockets are designed for loaded board testing. .039 (1.00) Centers - .160 (4.06) Stroke ...more -
075-40 series - Probes and Sockets QA Technology Company, Inc. Contact Info Send To Colleague The 075-40 series probes and sockets are designed for mixed height (dual level) loaded board testing. .075 (1.91) Centers - .400 (10.16) Stroke. ...more -
onTAP Boundary Scan (JTAG) Test Software Flynn Systems Corp. Contact Info Send To Colleague 
onTAP provides comprehensive boundary-scan test development tools with powerful run time software including pin-level diagnostics. onTAP provides everything required for robust JTAG test solutions. Robust ATPG for high fault coverage and precise pin-level diagnostics. Interconnect, Bus Wire, Pull-up/Pull-down, TAP Infrastructure tests, Shorts ...more
