Wafer Sort
TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics.
State of the art Electroglas probers
Sort experience with high probe count
Less than 4 mil pitch on probes
Experience with C4 Bump and Aluminum pad
Experience on Bipolar, CMOS, GaAs, & SiGe
Overhead sort or cable harness sort
Microsite testing capability
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TestEdge, Inc.
15930 Bernardo Center Drive
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