WaferView
The WaferView inspection and review systems are designed to maximize yield in lithography, CMP, etch, and bump applications. The full-color vision system has been fab-tested to catch critical defects missed by gray-scale systems, and its patented software, based on over a decade of semiconductor production experience, provides superior defect classification for high-confidence automated decision-making.
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Rudolph Technologies
One Rudolph Road
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