WS-2800 Advanced Defect Detection
Advanced defect detection for post-fab process management. For both standard and flip chip wafers up to 200mm in diameter, the WS-2800 Wafer Inspection System provides superior yield management for defect inspection throughout post-fab processes. Defects created in the post-fab area between wafer processing and final manufacturing can negatively impact production yields and time-to-market. The WS-2800 quickly and reliably locates wafer defects and classifies them?reducing process costs and improving yield.
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RVSI Electronics
425 Rabro Drive East
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