WAFERMAP-View.OCX
WAFERMAP-View.OCX for Windows is a software development kit for both the semiconductor and disk drive industry. It offers 7 different types of graphics of WAFERMAP for Windows as an ActiveX control.
WAFERMAP-View.OCX is the perfect solution for scanning ellipsometers, four point probes and others.
WAFERMAP-View.OCX employs an innovative object oriented visual programming interface to create and modify wafer plots. It was developed to satisfy the analysis and visualization needs of metrology equipment manufacturers.
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Boin GmbH
Haldenweg 25
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