Thin Film & Optical Measurement Systems
The most commonly used instrument for the measurement of the optical performance of thin-film coatings is a spectrometer. Using a StellarNet fiber optic spectrometer coupled to a reflectance probe and fiber optic light source, it is possible to measure film thickness by detecting the sinusoidal fringe pattern from the samples specular reflectance. The software calculates the film thickness from the frequency of the pattern as determined by the distance between peaks in the spectral data.
|
StellarNet
P.O. Box 1400
|
