T7722 - Advanced Mixedsignal Test System

SoC devices are advancing at a high pace toward lower voltage, higher power, and higher speed. Thereby, linear or mixed-signal devices are required to operate stably with little adverse effect from noise generated by high speed clock signals. The T7722 is able to achieve floor space reduction by 20% compared with our conventional test systems, and to achieve direct current tests with high accuracy and analog or digital tests at high speed. 

Advantest

3201 Scott Blvd.
Santa Clara, CA 95054
USA



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