T6575/6565/6535 - VLSI Test System

The T6575/6565/6535 achieves significantly higher driver voltage than that of the T6500 series. Therefore, stress tests can be easily performed. Further, by adding an optional high voltage power supply, the T6575/6565/6535 can also perform blown fuse and high stress voltage tests, the specialty of the T3300 series test systems. Therefore, the T6575/6565/6535 is the system bestsuited for replacing the T3300 series test systems. 

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3201 Scott Blvd.
Santa Clara, CA 95054
USA



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