T5383 - Memory Test System
The T5383 provides a timely response to these trends. From front-end test for DRAM to back-end test for FLASH memory, MCP/SIP, and other devices, the T5383 provides a high-throughput solution that offers flexible support for increasingly fast and versatile memory devices. In addition, T5383 high-density pin electronics deliver 50% more capacity than provided by its predecessor, T5377S, and within the same small footprint.
|
Advantest
3201 Scott Blvd.
|
