System 7700 - Characterization System
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
• R&D and engineering characterization • Mid-volume production test • Low-volume production test for critical parts • Low-voltage CCDs and IR FPAs • Military, science-grade and medical CCDs or IR FPAs • CMOS ROICs and multiplexers • CMOS sensors • High-performance, low-cost, open architecture • Low-noise system architecture • Small footprint with high instrument density • Expandable for future applications • Highest speeds
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Pulse Instruments
1234 Francisco St.
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