Sub-Micron Beam Analysis

A special member of the beam analysis family, offering both analytical and graphical capabilities for sub micron beam measurement and analysis applications. This is a custom measurement station composed of a CCD type sensor, supplemented with high magnification optics and the computing technology. This is a powerful beam diagnostics measurement system for real time measurement and display of small CW or pulsed lasers in the sub-micron range. 

Duma Optronics LTD

1st Hazait Street
P.O. Box 3370
Nesher, 20306
ISRAEL



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