Scanning Probe Microscope system - Solver HV
Solver HV is intended for work in high vacuum conditions and controllable gas medium. Measuring modes:
Contact AFM/ LFM/ ResonantMode (semicontact + noncontact AFM)/ Phase Imaging/ Force Modulation (viscoelastisity)/ MFM/ EFM/ Adhesion Force Imaging/Scanning Capacitance microscopy (SCM)/Scanning Kelvin probe microscopy(SKM)/Spreading Resistance Imaging (SRI)/ RM Lithography/AFM
|
NT-MDT Co.
Building 2, room 431, Technopark,
|
