SU-1500 Scanning Electron Microscope (SEM)

Compact & High-performance 20 % Reduction in Footprint Compared to the Current Model. VP Mode Standard. SE 3.0 nm Resolution at 30 kV, BSE 4.0 nm (6 Pa) Guaranteed. Accommodates Samples up to 152 mm (diameter) and 60 mm (height). Provides for Two EDX Symmetrical Ports.