SPM system Solver MFM
Delivers the complete solution for observation of magnetization reversal processes and other phenomena that depend on magnetic field in the range up to 2 kGauss (0,2 Tesla). Measuring modes:
SPM techniques:
In air: Atomic Force Microscopy (AFM) (contact + semicontact + non-contact)/ Lateral Force Microscopy (LFM)/ Phase Imaging mode/ Force Modulation mode/ Adhesion Force Imaging/ dc & ac Magnetic Force Microscopy (MFM) / Electrostatic Force Microscopy (EFM)/ Scanning Capacitance Microscopy (SCM)/ Kelvin Probe Microscopy (KPM)/ Spreading Resistance Imaging (SRI)
Spectroscopies:
AFM (force-volume imaging, amplitude-distance, phase-distance curves), MFM (surface magnetization versus in-plane external magnetic field
Lithographies:
AFM (Force (scratching + semicontact) and Current (dc + ac))
Nanomanipulation:
Contact Force
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NT-MDT Co.
Building 2, room 431, Technopark,
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