S-5500 Ultra-high Resolution Scanning Electron Microscope (SEM)

Like no other SEM in the world... The world's highest resolution 0.4nm at 30kV. Hitachi's unique variable super ExB signal mode allows operator to optimize secondary and backscatter signal content of the image. New BF/DF Duo-STEM detector allows simultaneous display of BF and DF images. Variable detection angle in DF STEM mode(option).