S-3700N Scanning Electron Microscope
The Analytical SEM for Studying Large, Heavy & Tall Samples. Large sample up to 300mm in diameter. Observable area up to 203mm in diameter. Observation and EDS analysis on a sample up to 110mm tall. Versatile port layout for various analytical applications.
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Hitachi High-Technologies
1-24-14 Nishi Shimbashi
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