RI-53 Transistor Test System
Transistor (HCI) Test System. Reliability system capable of testing up to 144 DUTs (276 TDDB) at once. This is not a typical HCI system. Instead of one or a few measurements, practically the full line of Reedholm dc parametric tests can be run, such as Vt, gm, peak Isub, Ids at Vgs, etc. In other words, dozens or even hundreds of tests, including sweeps (I/V curves), can be executed during the experiment.
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Reedholm Instruments
Four Sierra Way
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