RF Life Test
We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components that can be tested include:
FET's
GaAs Devices
Monolithic Microwave IC's
Hybrid Microwave IC's
Microwave Module Assemblies
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TestEdge, Inc.
15930 Bernardo Center Drive
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