Q-Scope™ Series - SCANNING PROBE MICROSCOPES / ATOMIC FORCE MICROSCOPES (SPM/AFM)
The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally modular design approach which delivers unmatched versatility and utility. Patented Isotopic Focal System™ permits 90 degree top-down view for easy alignment and positioning of the probe as well as tracking of cantilever/probe during scanning for increased sensitivity and elimination of laser light reflections from the sample.
AFM scanning assemblies offer scan ranges from 20um to 200um in X and Y and up to 17 um in Z.
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Ambios Technology, Inc.
100 Pioneer St.,
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