PS-400 - Near Field Probe Set

The model PS-400 Near Field probe set consists of two E-Field probes and a H-Field probe for board level radiated emissions testing. One of the two E-field probes is patented. It has a fine tip that allows noise measurement of pins on ICs and traces as narrow as 3 mils on a printed circuit board. The other E-field probe is used to find the vicinity of the highest emissions levels on the board. This probe has a higher amplitude sensitivity than the fine tip probe.

Com-Power Corporation

114 Olinda Drive
Brea, CA 92823
USA

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