NTS600 SERIESFlash Memory Test System

NTS600 Series Multi Site Flash Memory Test System. The NTS600 Series is a low cost 1 site to 64 site flash memory production wafersort and post- assembly test system. The system performs DC and functional tests on non-volatile memory devices. Novtek's unique architecture incorporates two pattern generators. The system consists of a software based algorithmic pattern generator and a high speed 10MHz hardware based pattern generator for high throughput production testing. The NTS600 Series utilizes a tester per DUT architecture with no shared resources between devices. Complete DC parametric and functional tests are performed in parallel on up to 64 devices.

Novtek Test Systems

2170 Paragon Drive
San Jose, CA 95131
USA



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