NTEGRA Solaris - Nearfield optical SPM system
Uses Scanning Near-Field Optical Microscopy (SNOM) to investigate optical properties beyond the
conventional limits imposed by diffraction. NTEGRA Solaris combines three different microscopy techniques: light, scanning nearfield optical
microscopy (SNOM), and atomic force microscopy (AFM). Integration at this advanced level
creates enormous design challenges because the conventional light microscope which uses standard
optics and mechanics cannot provide the accuracy, precision of movement, and stability required
for scanning probe microscopy or the efficiency necessary to collect the weak SNOM signal.
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NT-MDT Co.
Building 2, room 431, Technopark,
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