Model 1164 - Reliability Test System
The Aetrium Model 1164 Reliability Test System?s massively parallel architecture can run many tests, at many different temperatures, at the same time. It can be configured for a mix of: Copper/Aluminum Electromigration and Stress Migration, Copper ILD/Barrier BTS, Constant Voltage TDDB, SILC, MOS Hot Carrier, and NBTI. Package- and wafer-level testing are both supported
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Aetrium Incorporated
2350 Helen St.
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