MDC MERCURY PROBES may be connected to C-V plotters, computerized semiconductor measurement systems, curve tracers, or doping profilers for a variety of measurements. MERCURY PROBES eliminate time consuming metalization and their convenience make them ideal tools for production process monitoring applications. Their accuracy and reproducibility make them attractive for R&D applications. There are two types of Mercury Probes available. Standard and Mapping versions. All MDC Mercury Probes make three contacts to the sample wafer employing the unique MDC dot-ring configuration. This allows contact to be made in both front-back and front-front modes allowing for measurements on semi-insulating substrates. Also, a guard ring can be configured.
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Materials Development Corporation
21541 Nordhoff St., #B
Chatsworth, CA 91311
USA
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AutoTestSQL is a sophisticated, networkable, multi-user database application that allows easy creation of new test sequences, provides a simple run-time user interface and automatically stores results along with test sequence information (including test limits) on a session by session basis in an SQL database. ...more