M315X - Large Area Precision Blackbody
Designed to satisfy the exacting parameters of infrared focal plane array detectors, thermal imaging, and FLIR systems testing projection scene and field application, Mikron's M315X Series blackbody calibration sources combine high emissivity and unchallenged stability and uniformity. As part of an extensive range of general purpose and primary standards for testing and calibrating a wide variety of IR devices, the M315X Series embodies the accumulated expertise of 30 years of specialization in the discipline.
|
Mikron
16 Thornton Road
|
Related Searches:
In-circuit Test Systems
,
System Level Test
,
EMI Test Systems
,
Thermal Imaging
,
ESD Test Systems
,
Thermal Test
,
VXI Test Systems
,
System Test
,
Component Test Systems
,
Test Systems
,
Broadband Test Systems
,
Test Standards
,
IC Test Systems
,
Memory Test System
,
Black-Box Test
