InteFun 2700 & Functional Test Solutions

Integrating Functional and In-Circuit Test Solutions .The InteFun2700 and functional test services offer industry proven components that build a functional test strategy for a broad range of manufacturing test applications. Designed for production testing, our solutions are optimized for reliability, throughput, repeatability and cost. The InteFun 2700 test systems feature a scalable architecture and are designed to meet a wide range of requirements, such as:High speed analog & digital functional test · PXI and PXIe instrumentation. High speed digital test pattern generation, acquisition and analysis. National Instrument?s LabVIEW software development. Full In-Circuit Test (ICT). Feasa LED Analyser. Partnering with leading Boundary Scan (IEEE 1149.1) test providers. On-board Programming; Flash and In-system programming (ISP) of PLD, CPLD, etc.. Full turnkey integration services of fixture and software.

The Test Connection, Inc.

11400 Cronridge Drive
Suite H
Owings Mills, MD 21117
USA

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