In-Line Shelf Card (ILSC)
The In-Line Shelf Card allows customers to have a state of the art engineering solution for the challenges of fine pad pitch in-line probing. The In-Line Shelf Card can test 32 DUTs simultaneously via its cantilever needle configuration, and continues the Probe 2000 mission to improve testing capability at the wafer level. To ensure even beam length, to balance contact force and to minimize pad damage, custom fixtures and ring designs are employed.
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Probe 2000
1015 East Brokaw
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