IST-6500 RAM Tester
The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions. The programmable dynamic loading combined with high speed dual threshold comparators allows the user to program the DUT output loading across a wide range of operating conditions. This test is especially critical in SIMM devices, since they must often drive large capacitive and low resistance loads. The 6500 is equipped with a RS-232 port for PC interface and an Automatic Handler Interface with "Bin Sort" feature that allows the unit to sort devices based on the value of a selected device operating parameter which makes it ideal for engineering component characterization or fast "GO/NO GO' production testing.
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IST Information Scan Technology
487 Gianni St
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