HF-Injection Probe 501, 502, 503
Up to now the RF of a certain power was coupled into the pins of an IC to characterize its disturbance immunity. The IC's malfunction then indicated any internal interference. This measuring method has now been refined thanks to the new probes in the 500 series of the IC test system: The RF disturbance from the power amplifier flows through the connected probe to the pin under examination. An RF current and voltage measurement is carried out in the probe tip at the same time.
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Langer EMV-Technik GmbH
Nöthnitzer Hang 31
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