Galaxy™ Test
Galaxy™ Test is a comprehensive test automation solution within the Galaxy Design Platform that offers designers of ASICs and SoCs the fastest and most cost effective path to high-quality manufacturing tests and working silicon. Test synthesis - concurrent with physical implementation, power and timing optimization - speeds closure of test-ready designs. Test data compression and tester time reduction using DFT MAX dramatically reduces tester costs.
Highest quality test patterns using TetraMAX® ATPG, the industry's most advanced solution for targeting nanometer defects
Graphical debug environment with waveform viewer quickly isolates and corrects causes of DFT problems that tend to create project bottlenecks
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Synopsys
700 East Middlefield Rd.
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