Focused Ion Beam
Focused Ion Beam (FIB) systems can be employed to make precision modifications to a variety of samples. These modifications can be as simple as a single probe hole to metal 1, or as complex as a three-dimensional cross-section of a circuit
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IBM Analytical Services
1580 Route 52
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DX/256x256 - Digital Data Switching Systems Cytec Corp. Contact Info Send To Colleague 
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