FB-2100 FIB Nano Mechanical Probing System
FB-2100 is a Focused Ion Beam nano mechanical probing system. S)TEM/SEM specimen can be prepared with rapidity and accuracy. High milling rate with accelerating voltage up to 40kV. In-situ microsample extraction from specific site with Hitachi's patented "Micro-sampling" (optional accessory).
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Hitachi High-Technologies
1-24-14 Nishi Shimbashi
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